Elongated Contact Pads for 3D IC Thermal Alignment

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Solution Overview

Problem

In three-dimensional (3D) and 2.5D integrated circuits, substrates with different coefficients of thermal expansion misalign due to thermal expansion mismatches, causing contact pads to misalign at elevated temperatures, which affects electrical connections.

Innovation Solution

The implementation of elongated contact pads that maintain alignment at both room temperature and elevated temperatures by varying their shape and size based on position and thermal expansion mismatch, ensuring continued electrical connectivity during thermal processes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If standard contact pads are used on substrates with different coefficient of thermal expansion, then the pads align at room temperature, but they misalign at elevated temperatures due to thermal expansion mismatch

Engineering Contradiction:
Improvepad alignmentVSAvoidelectrical connection stability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The contact pads are designed with non-uniform dimensions, specifically elongated in the radial direction from the substrate center. Pads farther from the center have greater elongation to compensate for their larger thermal expansion displacement. This local variation in pad geometry ensures that each pad maintains alignment with its corresponding bump across the temperature range, resolving the contradiction between room temperature alignment and elevated temperature reliability.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent modifies the geometric parameters of the contact pads by elongating them radially based on their distance from the substrate center. This parameter change compensates for the thermal expansion mismatch between the substrate and die, allowing the pads to maintain proper alignment with the bumps at both room temperature and elevated temperatures during solder reflow processes.

Inventive Principle:
Principle #35Parameter changes

2Adaptability or versatility

If the substrate and die have different coefficients of thermal expansion, then the die can be manufactured with standard materials, but misalignment occurs during solder reflow at elevated temperatures

Engineering Contradiction:
Improvematerial selection flexibilityVSAvoidbump-to-pad alignment
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The contact pads exhibit local quality through their radially varying elongation. Pads at different radial positions have different elongation amounts, with outer pads being more elongated than inner pads. This local differentiation compensates for the cumulative thermal expansion mismatch that increases with distance from the substrate center, maintaining alignment precision across the entire die-substrate interface during temperature cycling.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The pad elongation is pre-designed and fabricated into the substrate before the actual bonding process. This preliminary geometric compensation ensures that when thermal expansion occurs during solder reflow, the elongated pads naturally accommodate the expansion differential and maintain alignment with the bumps, preventing misalignment issues without requiring additional adjustment steps.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The elongated pads effectively maintain alignment and electrical contact between the die and substrate at elevated temperatures, such as during solder reflow, and return to alignment upon cooling, enhancing the reliability of 3D and 2.5D integrated circuits.

Implementation Method 1

Due to the difference in coefficient of thermal expansion, the substrates of the 3DICs may misalign. Furthermore, large monolithic dies with small contact bumps may also misalign from the contact pads of a substrate the monolithic die is connected to due to a mismatch om the coefficient of thermal expansion between the monolithic die and the substrate.

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Data Source

PatentUS10050003B2Elongated pad structure
Publication Date: 2018.08.14 INPHI CORPORATION
  • US10050003B2 patent drawing
  • US10050003B2 patent drawing
  • US10050003B2 patent drawing

AI summary

A 3DIC includes a die and a substrate. The die includes multiple bumps to provide electrical connection the substrate. The substrate includes multiple elongated contact pads. The elongated contact pads making electrical contact with the bumps and shaped to maintain alignment with the bumps over a temperature range.