EM Resistivity Imaging Without Inversion During Drilling
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Solution Overview
Problem
The increasing complexity and cost of downhole logging tools, such as electromagnetic (EM) logging tools, are exacerbated by the large volume of data generated, necessitating more sophisticated and costly inversion and table lookup processes for accurate formation imaging.
Innovation Solution
A method for quick-look resistivity imaging using apparent conductivity curves derived from EM propagation resistivity and directional measurements, eliminating the need for inversion and table lookups, which can be applied to both 1D and 3D formation imaging.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sophisticated inversion and table lookup processes are used for accurate formation imaging, then measurement precision is improved, but device complexity and processing time increase
Solution Approach 1:
The patent extracts and eliminates the complex inversion and table lookup processes from the formation imaging workflow. By deriving direct analytical solutions from electromagnetic propagation measurements, the method removes the need for these sophisticated computational steps while maintaining imaging accuracy, thereby reducing device and processing complexity.
Solution Approach 2:
The patent replaces expensive, computationally intensive inversion algorithms with simpler, faster analytical methods. This substitution uses more straightforward mathematical relationships that require less computational power and processing time, effectively trading complex long-processing methods for simpler quick methods.
2Measurement precision
If sophisticated inversion and table lookup processes are used for accurate formation imaging, then measurement precision is improved, but processing time increases
Solution Approach 1:
The patent removes the time-consuming inversion and table lookup processes from the imaging workflow. By using direct analytical solutions based on electromagnetic propagation measurements, the method eliminates these computational bottlenecks and achieves rapid formation imaging without sacrificing accuracy.
Solution Approach 2:
The patent skips the intermediate computational steps of inversion and table lookups by directly calculating formation properties from electromagnetic measurements. This rushing through the process using analytical solutions dramatically reduces processing time while maintaining measurement precision.
3Measurement precision
If logging tools become more accurate, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent substitutes complex mechanical and computational systems with simpler electromagnetic-based analytical methods. By using direct mathematical relationships between electromagnetic propagation measurements and formation properties, the method replaces the need for complex tool hardware and sophisticated processing algorithms with more straightforward measurement and calculation approaches.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and cost-effective resistivity imaging without the overhead of inversion and table lookups, providing accurate formation delineation and steering control during drilling operations.
Implementation Method 1
EM propagation measurements are generated during a drilling operation. A data processing system then calculates a resistivity image for the formation utilizing at least one EM propagation measurement
Data Source
AI summary
Techniques and systems for generating resistivity images. A system includes an electromagnetic (EM) logging tool configured to generate EM propagation measurements during a drilling operation. The system also includes a processing system configured to be coupled to the EM logging tool, wherein the processing system is configured to calculate a resistivity image for a formation utilizing at least one EM propagation measurement of the EM propagation measurements and without use of an inversion technique or lookup table; and transmit the resistivity image for display on a display.