Near-Field EM Simulation for IC Side-Channel Analysis
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Solution Overview
Problem
Side-channel attacks can non-invasively extract sensitive information from devices by exploiting physical emissions like power noise and electromagnetic radiation, making it difficult to model and prevent such information leakage from integrated circuits (ICs) before fabrication.
Innovation Solution
A method for near-field electromagnetic simulation that identifies security-sensitive regions in ICs by simulating EM field strengths for grid partitions based on cryptographic workloads, using a time-domain algorithm to calculate EM field transient waveforms and perform linear superposition of wire currents, allowing for efficient identification and redesign of ICs to mitigate data leakage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If full EM simulation is performed for all wire segments on top metal layers, then accurate side-channel emission analysis is achieved, but computational complexity and simulation time become prohibitive due to vast number of wires (100+ million)
Solution Approach 1:
The patent divides the chip into multiple grid partitions and identifies security-sensitive regions that contribute most to EM emissions. By segmenting the simulation domain and focusing computational resources on sensitive regions rather than all 100+ million wires, the method achieves accurate side-channel emission analysis while reducing simulation complexity and time.
2Loss of information
If detailed EM simulation is performed for all grid partitions, then complete emission profile is obtained, but computational resources and simulation time increase significantly
Solution Approach 1:
The patent applies different simulation strategies to different regions: detailed EM simulation is performed only on identified security-sensitive grid partitions where emissions matter, while non-sensitive regions use simplified models or are excluded. This local quality approach preserves complete emission information for sensitive areas while dramatically improving simulation efficiency.
Solution Approach 2:
Instead of performing exhaustive simulation on all grid partitions, the method performs partial simulation only on the subset of sensitive regions identified through initial analysis. This partial action approach maintains productivity by avoiding unnecessary simulations on non-sensitive areas while still capturing complete emission information from regions that actually contribute to side-channel leakage.
3Measurement precision
If EM simulation is performed with high detail for all regions, then accurate identification of emission sources is achieved, but computational resources required become prohibitive
Solution Approach 1:
The patent performs preliminary analysis to identify security-sensitive grid partitions before conducting detailed EM simulation. This preliminary action filters out non-sensitive regions upfront, so that subsequent high-detail simulations are applied only where needed. This approach achieves accurate emission source identification while minimizing computational resource consumption by avoiding detailed simulation of irrelevant regions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables fast and accurate simulation of EM side-channel emission analysis, reducing computational resources and allowing for pre-fabrication redesigns that minimize sensitive data leakage, thereby enhancing security against side-channel attacks.
Implementation Method 1
contributions of the EM fields from the non-security sensitive regions for the EM side-channel emission analysis are based on a linear superposition of wire currents in the non-security sensitive regions of the IC
Implementation Method 2
side-channel attacks can extract secret information from a running chip by exploiting physical emissions such as power noise and electromagnetic (EM) radiation
Data Source
AI summary
Methods, machine readable media and systems for near-field electromagnetic simulation for side-channel emission analysis of an integrated circuit (IC) are described. In one embodiment, a method can include the following operations: simulating EM field strengths for a plurality of grid partitions of a circuit area of the IC based on a cryptographic work load applied to a model of the IC; identifying one or more of the grid partitions as a security sensitive region for the IC based on the EM field strengths, wherein one or more grid partitions outside of the security sensitive region are identified as non-security sensitive regions for the IC; and simulating EM fields for the IC to perform the EM side-channel emission analysis, wherein contributions of the EM fields from the non-security sensitive regions for the EM side-channel emission analysis are based on a linear superposition of wire currents in the non-security sensitive regions of the IC.