EM Wave Measurement Point Calculation for Interference Testing
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Solution Overview
Problem
Current radiation interference wave tests require a large number of measurement points due to the need to change antenna height and angle, leading to prolonged testing times, especially at higher frequencies where the wavelength is shorter, necessitating a more efficient method to reduce the number of measurement points.
Innovation Solution
An electromagnetic wave measurement point calculation program that calculates a correction coefficient based on the relative positional relation between the test body and the antenna, allowing for optimized measurement height intervals that satisfy the sampling theorem, and uses interpolation to reduce the number of measurement points, thereby shortening the testing time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of measurement points is increased to ensure measurement precision across wide frequency bands, then the measurement precision is improved, but the testing time becomes excessively long
Solution Approach 1:
The patent divides the wide frequency band into multiple sub-bands and performs measurements separately for each sub-band. This segmentation allows the system to use appropriate measurement intervals for each frequency range, avoiding the need to use extremely fine intervals across the entire wide band, thus reducing total measurement points while maintaining precision where needed
Solution Approach 2:
The patent applies measurement intervals that are finer than the minimum required by the sampling theorem only in specific frequency ranges or for specific measurement conditions, rather than uniformly across all frequencies. This partial application of excessive measurement density ensures precision is maintained where necessary while reducing unnecessary measurements in other regions
2Measurement precision
If the antenna height interval is reduced to satisfy the sampling theorem for high frequencies, then the measurement precision is improved, but the number of measurement points increases dramatically
Solution Approach 1:
The patent dynamically changes the measurement interval parameter based on the frequency being measured. For high frequencies where short wavelengths require fine sampling, the interval is reduced accordingly. For lower frequencies, the interval is increased. This parameter adaptation allows satisfaction of the sampling theorem where needed while reducing the total number of measurement points
Solution Approach 2:
The measurement system transitions from a static, uniform measurement interval approach to a dynamic approach where the interval is adjusted according to frequency. The system automatically modifies measurement parameters in real-time based on the current measurement conditions, optimizing the balance between precision requirements and measurement efficiency
3Productivity
If the spectrum analyzer measures a wide frequency band simultaneously, then the productivity is improved, but the measurement time becomes longer due to the complexity of processing wide band data
Solution Approach 1:
The patent segments the wide frequency band measurement into multiple narrower sub-band measurements. By dividing the wide band into manageable portions and measuring them separately, the system reduces the computational complexity of spectrum analysis for each individual measurement, thereby reducing the time required for data processing while still achieving complete wide-band coverage
Data Source
AI summary
An electromagnetic wave measurement point calculation program causing a computer to execute: a correction coefficient calculating function of calculating a correction coefficient for which an interval of heights of an antenna satisfies a sampling theorem based on a relative positional relation between a test body including a radiation source radiating a radiation interference wave and the antenna performing measurement of at least one of an electric field and a magnetic field of the radiation interference wave and a reflection coefficient of the radiation interference wave on a floor face on which the test body is placed; and a measurement height calculating function of sequentially calculating the heights of the antenna in a case in which the measurement is performed using the correction coefficient.