Embedded Controller Diagnostic via Display Backlight
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Solution Overview
Problem
Diagnosing and reporting faults in information handling systems are challenging due to the potential malfunctioning of critical subsystems necessary for diagnostic functions, especially since these subsystems may not be initialized or operational during failures.
Innovation Solution
An embedded controller in the motherboard of an information handling system administers a test routine and utilizes a built-in self-test feature of the primary display device to evaluate and indicate the functionality of motherboard resources, displaying results through a sequence of colors, with the backlight indicating pass or fail conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If diagnostic functions are performed using critical subsystems, then fault detection capability is improved, but the system becomes unreliable when those subsystems malfunction or are not initialized
Solution Approach 1:
The patent introduces a dedicated diagnostic subsystem that acts as an intermediary between the fault and the diagnostic output. This separate subsystem can perform diagnostic functions independently of the critical subsystems being tested, ensuring that diagnostic capability remains reliable even when those subsystems fail or are not yet initialized.
2Stability of the object's composition
If the system waits for the central processing unit to be initialized before performing diagnostics, then system stability is improved, but the time required for fault identification increases
Solution Approach 1:
The patent performs diagnostic actions before the central processing unit is fully initialized. The embedded controller executes diagnostic routines during the initialization sequence, allowing fault identification to begin in advance rather than waiting for complete system readiness.
3Measurement precision
If multiple diagnostic routines are executed to thoroughly evaluate motherboard resources, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent implements self-test capabilities where the system uses its own embedded controller and existing hardware resources to perform diagnostics without requiring external diagnostic equipment. The display device's built-in self-test function is leveraged, allowing the system to diagnose itself using components already present in the hardware architecture.
Data Source
AI summary
A method includes invoking, by an embedded controller at an information handling system, a test procedure to evaluate functionality of motherboard resources at the information handling system. A result of the test procedure is displayed at a primary display device using a built in self test function incorporated at the primary display device.