Embedded Electronic Component Electrode With Low-Reflection Layer
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Solution Overview
Problem
The precision of via hole formation in circuit boards is compromised due to light energy reflection during laser processing, leading to deteriorated connectivity between electronic components and conductive vias, affecting the performance of embedded electronic components.
Innovation Solution
The implementation of an electronic component with a low-reflection layer, specifically a Ni—Zn-based material containing needle-shaped particles and an oxide film, which reduces surface brightness to 45% or less, thereby minimizing light energy reflection and improving processing precision during via hole formation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If a conventional external electrode with high reflectivity is used, then the manufacturing process is simple, but light energy reflection during laser processing deteriorates via hole formation precision and connectivity
Solution Approach 1:
The external electrode is segmented into multiple layers: a base layer (first external electrode layer) and a low-reflection layer (second external electrode layer). This segmentation allows the base layer to provide structural foundation while the low-reflection layer specifically addresses light reflection issues, thereby improving via hole formation precision without compromising electrode functionality.
Solution Approach 2:
The low-reflection layer is constructed using composite materials including Ni-Zn-based material with needle-shaped particles and oxide film. This composite structure reduces light reflectivity to 45% or less while maintaining electrical conductivity and adhesion properties, resolving the contradiction between manufacturing precision and device complexity.
2Object-affected harmful factors
If a low-reflection layer with Ni-Zn-based material and needle-shaped particles is implemented, then light energy reflection is reduced to 45% or less, but the external electrode structure becomes more complex
Solution Approach 1:
The low-reflection layer changes key parameters including material composition (Ni-Zn-based alloy), particle morphology (needle-shaped particles), and surface properties (oxide film formation). These parameter changes reduce light reflectivity to 45% or less while the layered structure maintains electrode functionality, effectively managing the trade-off between reducing harmful reflection and controlling structural complexity.
3Reliability
If the brightness of the external electrode surface is high, then the manufacturing and inspection process is easier, but light energy reflection during laser processing increases, deteriorating connectivity
Solution Approach 1:
The invention converts the harmful effect of high reflectivity into a beneficial property by deliberately designing a low-reflection layer with controlled brightness. The needle-shaped particles and oxide film create a surface that reduces light reflection to 45% or less, transforming the potential harm (light reflection interfering with laser processing) into a benefit (improved via hole formation precision and connectivity).
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the connectivity between electronic components and conductive vias by reducing light energy reflection, resulting in improved processing precision and reliability of the electronic components embedded in circuit boards.
Implementation Method 1
a low-reflection layer, specifically a Ni—Zn-based material containing needle-shaped particles and an oxide film, which reduces surface brightness to 45% or less, thereby minimizing light energy reflection
Data Source
AI summary
An electronic component includes a body including a dielectric layer and an internal electrode, and an external electrode disposed on the body, connected to the internal electrode, and including a low-reflection layer. Brightness of a surface of the low-reflection layer is lower than brightness of a surface of the body.