Embedded Flex Substrate Packaging for High-Density 3D Interconnects
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Solution Overview
Problem
Existing semiconductor device packages face challenges in accommodating sophisticated features that impact reliability, performance, and cost, necessitating improved configurations.
Innovation Solution
A semiconductor device with an embedded flex substrate, featuring a semiconductor die mounted on a package substrate and a flex substrate sub-assembly with patterned flexible conductive traces, encapsulated to allow for flexible, high-density, and cost-effective 3D interconnects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional semiconductor device packages are used, then manufacturing and assembly are simpler, but reliability and performance are lower when accommodating sophisticated features
Solution Approach 1:
The package substrate is divided into distinct functional regions including a first substrate region for mounting the semiconductor die and a second substrate region for mounting external components. This segmentation allows each region to be optimized for its specific function, improving overall device reliability while maintaining manageable complexity through modular design.
Solution Approach 2:
The package substrate utilizes a multi-layer three-dimensional configuration with conductive traces extending across different substrate regions and layers. This 3D interconnect architecture enables sophisticated feature integration and improved signal routing without proportionally increasing planar footprint, thereby enhancing performance while controlling complexity.
2Adaptability or versatility
If package configuration is optimized for sophisticated features, then application-specific performance improves, but manufacturing cost increases
Solution Approach 1:
The package substrate is designed as a multi-functional platform that can simultaneously accommodate semiconductor dies, passive components, active components, and various interconnect structures within a single substrate. This universal design allows the same substrate architecture to serve multiple application-specific needs without requiring entirely different package designs, thereby controlling manufacturing costs while maintaining adaptability.
Solution Approach 2:
The package substrate incorporates flexible conductive traces and configurable interconnect structures that can be adapted to different mounting configurations and electrical connection requirements. This dynamic design flexibility allows the same basic substrate to be manufactured with variations tailored to specific applications, optimizing performance without proportionally increasing manufacturing complexity and cost.
3Productivity
If higher density interconnects are implemented, then device performance improves, but manufacturing complexity increases
Solution Approach 1:
The package substrate implements three-dimensional interconnect structures with conductive traces distributed across multiple layers and substrate regions. This vertical stacking and multi-layer routing achieves higher interconnect density by utilizing the third dimension (depth/height) rather than only planar expansion, thereby improving productivity without proportionally increasing lateral complexity.
Solution Approach 2:
The interconnect structure employs nested conductive traces where signal paths are routed through multiple layers and regions of the substrate in a nested configuration. This nesting approach allows multiple interconnect functions to be integrated within the same physical footprint, achieving high density while organizing complexity in a hierarchical manner that simplifies manufacturing.
Data Source
AI summary
A method of forming a semiconductor device is provided. The method includes interconnecting a semiconductor die and a flex substrate sub-assembly with a package substrate. The flex substrate sub-assembly includes a flexible conductive trace. A first portion of the flexible conductive trace is conductively connected to the package substrate. The method further includes encapsulating with an encapsulant at least a portion of the semiconductor die and the flex sub-assembly. A second portion of the flexible conductive trace is exposed at a top surface of the encapsulant.


