Method of fabricating a semiconductor package

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Solution Overview

Problem

Existing semiconductor packaging technologies face challenges in achieving high-density wiring, efficient thermal management, and improved electrical characteristics, particularly in compact and high-performance electronic devices.

Innovation Solution

The proposed semiconductor package incorporates an interposer chip with a high line density redistribution layer and vertically extending vias, which is embedded within a core portion of the substrate. This configuration enables efficient electrical connections between semiconductor chips and facilitates thermal dissipation through high thermal conductive materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If an interposer chip with high line density redistribution layer is used, then wiring freedom and electrical characteristics are improved, but device complexity increases

Engineering Contradiction:
Improvewiring freedomVSAvoidpackage structure complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent introduces an interposer chip as an intermediary component between the substrate and semiconductor chips. This interposer chip includes a redistribution layer with high line density that acts as a mediator to achieve flexible wiring connections. The redistribution layer with patterns having different widths allows for optimized signal routing, while the interposer chip itself serves as the intermediate structure that manages the complexity of connecting multiple chips with varying pin configurations.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Length of moving object

If vertically extending vias are implemented in the interposer chip, then electrical connection length is reduced, but manufacturing precision requirements increase

Engineering Contradiction:
Improveelectrical connection lengthVSAvoidvia alignment precision
Core Design Contradiction:
Length of moving objectVSManufacturing precision

Solution Approach 1:

The patent transitions from horizontal/w lateral routing to vertical routing by implementing vias that extend in the thickness direction of the interposer chip. This dimensional change allows electrical connections to be made more directly between upper and lower surfaces, reducing the overall connection length. The vertical via structure provides a more direct pathway for electrical signals compared to traditional planar routing methods.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If high line density redistribution layer is used, then electrical characteristics are improved, but thermal management challenges increase

Engineering Contradiction:
Improveelectrical characteristicsVSAvoidthermal dissipation
Core Design Contradiction:
ReliabilityVSTemperature

Solution Approach 1:

The patent employs composite material structures in the interposer chip, combining conductive materials for the high line density redistribution layer with thermally conductive materials for heat dissipation. The redistribution layer uses high-conductivity metal patterns for electrical performance, while the substrate and surrounding structures incorporate materials with high thermal conductivity to facilitate heat removal from the densely packed wiring regions.

Inventive Principle:
Principle #40Composite materials

4Reliability

If interposer chip is embedded in core portion, then packaging performance is improved, but manufacturing process complexity increases

Engineering Contradiction:
Improvepackaging performanceVSAvoidfabrication process ease
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent implements preliminary actions by pre-fabricating the interposer chip with its redistribution layer and via structures before embedding it into the substrate's core portion. This allows the complex interposer structure to be manufactured separately using optimized semiconductor fabrication processes, then integrated into the final package. The embedding process itself is performed as a distinct step after the interposer is prepared, separating the complex fabrication tasks into manageable stages.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution achieves a high degree of freedom in wiring, enhanced thermal radiation efficiency, and improved electrical characteristics, such as reduced electrical connection length and increased packaging performance.

Implementation Method 1

a via in the base layer, the via connecting the redistribution layer to the first wiring layer

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 2

facilitates thermal dissipation through high thermal conductive materials

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS12334445B2Method of fabricating a semiconductor package
Publication Date: 2025.06.17 SAMSUNG ELECTRONICS CO LTD
  • US12334445B2 patent drawing
  • US12334445B2 patent drawing
  • US12334445B2 patent drawing

AI summary

A semiconductor package and associated methods, the package including a substrate; first and second semiconductor chips on the substrate; and external terminals below the substrate, wherein the substrate includes a core portion; first and second buildup portions on top and bottom surfaces of the core portion, the first and second buildup portions including a dielectric pattern and a line pattern; and an interposer chip in an embedding region in the core portion and electrically connected to the first and second buildup portions, the interposer chip includes a base layer; a redistribution layer on the base layer; and a via that penetrates the base layer, the via being connected to the redistribution layer and exposed at a surface of the base layer, the redistribution layer is connected to a line pattern of the first buildup portion, and the via is connected to a line pattern of the second buildup portion.