Embedded MIB Capacitor Layout for Low-Impedance IC Packages

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Solution Overview

Problem

Integrated-circuit packages face challenges with high interconnect density due to undesired inductance loops and impedance peak profiles in power-delivery networks, particularly in multi-chip packages.

Innovation Solution

Embedding molded interconnects bridges (MIBs) with passive devices like decoupling capacitors in the die side of IC package substrates, facilitating power delivery networks by proximity, reducing package inductance looping, and lowering impedance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If high interconnect density is implemented in multi-chip packages, then interconnect capacity is improved, but undesired inductance loops and impedance peak profiles occur in power-delivery networks

Engineering Contradiction:
Improveinterconnect densityVSAvoidpower-delivery network performance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent transitions from planar interconnect layouts to three-dimensional stacked architectures, utilizing vertical vias and multiple layers to route power and ground signals in different spatial dimensions. This dimensional change allows high interconnect density while minimizing planar loop areas that cause inductance, thereby resolving the contradiction between density and power-delivery performance

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements nested power delivery structures where ground vias are positioned within or adjacent to power vias, creating concentric or nested current paths. This nesting approach minimizes the loop area between power and ground returns, reducing inductance while maintaining high interconnect density in the multi-chip package

Inventive Principle:
Principle #7Nested doll (Nesting)

2Ease of manufacture

If passive devices are placed farther from integrated-circuit dice, then manufacturing complexity is reduced, but power delivery efficiency and electrical performance deteriorate

Engineering Contradiction:
Improvedevice assembly complexityVSAvoidpower delivery efficiency
Core Design Contradiction:
Ease of manufactureVSUse of energy by moving object

Solution Approach 1:

The patent utilizes the vertical dimension by embedding passive devices within the substrate layers and connecting them through via structures rather than requiring lateral placement. This vertical integration allows passive devices to be positioned close to dice in the Z-direction while maintaining manageable manufacturing processes, thereby improving power delivery efficiency without excessively increasing assembly complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent combines passive devices with the substrate structure itself, integrating capacitors and other components directly into the substrate layers rather than as separate surface-mounted elements. This merging approach reduces the distance between passive devices and dice, improving power delivery efficiency while consolidating manufacturing steps

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentEP4657524A2Molded interconnects in bridges for integrated-circuit packages
Publication Date: 2025.12.03 INTEL CORP
  • EP4657524A2 patent drawingFigure 1A~1C
  • EP4657524A2 patent drawingFigure 2A~2C
  • EP4657524A2 patent drawingFigure 3~5

AI summary

Disclosed embodiments include an integrated-circuit package (101, 201, 310, 410) comprising an integrated-circuit package substrate (120) having a die side (121) and a land side (119) opposite the die side; a molded interconnect bridge (110) embedded in the integrated-circuit package substrate, the molded interconnect bridge comprising a molding-mass frame (112); a plurality of capacitors (116, 118) embedded in the molding-mass frame, wherein the plurality of capacitors occupy a portion of the vertical space encompassed by the molding-mass frame; and a build-up layer (114, 214, 314, 414) of the molded interconnect bridge on a surface of the molding-mass frame, wherein the build-up layer of the molded interconnect bridge is closer to the die side of the integrated-circuit package substrate than to the land side of the integrated-circuit package substrate, wherein conductive structures in the build-up layer of the molded interconnect bridge are coupled to the plurality of capacitors.