Embedded Semiconductor Circuit Board Thermal Stress Management
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Solution Overview
Problem
Circuit boards with embedded semiconductor elements face issues of warpage and delamination due to thermal stress caused by differences in the coefficient of thermal expansion between various components, limiting their anti-flexural strength, reliability, and ability for high integration and miniaturization.
Innovation Solution
A circuit board structure with a carrier board having through holes, where semiconductor elements are secured using high-strength encapsulation layers that integrate to prevent warpage and delamination, and a fabrication method that forms a circuit build-up structure on the outer surface of these encapsulation layers, enhancing rigidity and reliability while allowing for higher layer integration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If circuit build-up is processed on both upper and lower surfaces to form symmetrical structure, then warpage is prevented, but manufacturing complexity increases and circuit layout flexibility is reduced
Solution Approach 1:
The patent applies asymmetry by processing circuit build-up only on one surface of the core circuit board rather than both surfaces. The method forms dielectric layers and circuit layers alternately stacked on the surface of the core circuit board, with conductive structures formed in the dielectric layers, creating an asymmetrical build-up structure that simplifies manufacturing while accommodating different circuit layout requirements for upper and lower surfaces.
Solution Approach 2:
The patent segments the circuit board into a core circuit board and separate build-up layers. The core circuit board serves as the base structure, while dielectric layers and circuit layers are segmented and stacked alternately on one surface. This segmentation allows independent optimization of the core board and the build-up structure, reducing manufacturing complexity while maintaining stability.
2Quantity of substance
If circuit density on one surface is higher than the other, then high integration is achieved, but thermal stress imbalance causes warpage and delamination
Solution Approach 1:
The patent applies local quality by concentrating high-density circuit build-up only on the surface requiring high integration, while the opposite surface maintains lower circuit density. The dielectric layers and circuit layers are alternately stacked and configured according to local circuit density requirements, allowing high integration where needed while maintaining thermal stress balance across the entire board structure.
Solution Approach 2:
The patent uses composite materials by alternating dielectric layers with different coefficients of thermal expansion and circuit layers. This composite structure is designed to balance thermal stresses - the dielectric layers provide mechanical support and thermal management, while the circuit layers provide electrical functionality. The alternating stack compensates for thermal expansion differences, preventing warpage and delamination even with asymmetric circuit density.
3Volume of moving object
If semiconductor elements are embedded in the core circuit board, then high integration and miniaturization are achieved, but thermal stress causes damage to the embedded elements
Solution Approach 1:
The patent applies nesting by embedding semiconductor elements within the core circuit board structure. Through holes are formed in the core circuit board, and semiconductor elements are received and secured inside these through holes. The dielectric layers and encapsulation structures surround and protect the embedded elements, creating a nested configuration that achieves miniaturization while providing mechanical protection and thermal stress isolation.
Solution Approach 2:
The patent provides beforehand cushioning by forming encapsulation layers around the embedded semiconductor elements before final assembly. The encapsulation layers, formed from the alternating dielectric and circuit layers, act as protective cushions that absorb and distribute thermal stresses. This pre-formed protection prevents direct transmission of thermal stress to the sensitive semiconductor elements during temperature changes in fabrication and operation.
4Reliability
If encapsulation layers are formed to secure semiconductor elements, then reliability is improved, but manufacturing steps increase
Solution Approach 1:
The patent merges multiple functions into the encapsulation layers. The same dielectric layers and circuit layers that provide electrical functionality are also used to encapsulate and secure the semiconductor elements. The encapsulation layers serve dual purposes: electrical insulation/circuit functionality and mechanical securing/protection of embedded elements. This merging reduces the need for separate encapsulation processes and materials, simplifying manufacturing while improving reliability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively prevents warpage and delamination, enhances the reliability and quality of the circuit board, and allows for higher integration and miniaturization by securing semiconductor elements within the board, improving thermal stress resistance and electrical capability.
Implementation Method 1
a difference in the coefficient of thermal expansion (CTE) causes uneven thermal stress, which in turn causes warpage and other problems
Data Source
AI summary
A circuit board structure with an embedded semiconductor element and a fabrication method thereof are disclosed according to the present invention. The circuit board structure comprises: a carrier board having a first surface, a second surface, and at least one through hole penetrating the carrier board from the first surface to the second surface; a first semiconductor element received in the through hole and having an active surface and an inactive surface, the active surface having a plurality of electrode pads; at least one second semiconductor element mounted on the carrier board; a first encapsulation layer formed on the first surface of the carrier board to block one end of the through hole; and a second encapsulation layer formed on the second surface of the carrier board.


