Embedded Sensor Characterization for Counterfeit Programmable Devices
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Solution Overview
Problem
Current methods for identifying counterfeit electronic devices are invasive, destructive, and costly, and cannot assess device integrity once the device is assembled into a system, limiting their effectiveness across the device lifecycle.
Innovation Solution
A programmable device characterization system that embeds sensors using telemetry sensor bitstreams to measure and generate device characterization information, allowing for non-destructive categorization and verification of devices throughout their lifecycle, from manufacture to deployment, without requiring specialized external equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If destructive testing or specialized test equipment is used to identify counterfeit devices, then measurement precision and reliability are improved, but device complexity and cost increase, and the devices must be removed from systems
Solution Approach 1:
The patent implements self-service by embedding sensors directly within the programmable device that can autonomously collect and report device characteristics without requiring external specialized testing equipment. The device characterizes itself by having its sensors programmed to gather specific measurements, eliminating the need for complex external test appliances and allowing verification while the device remains installed in the system.
Solution Approach 2:
The patent applies preliminary action by pre-programming sensor construction information and telemetry bitstreams into the device during manufacturing or configuration phases. This allows the device to have characterization capabilities built-in beforehand, enabling future verification without requiring complex external testing equipment when the device is deployed or suspected of being counterfeit.
2Measurement precision
If devices are removed from systems for testing, then measurement precision is improved, but productivity and ease of operation deteriorate
Solution Approach 1:
The embedded sensors enable the device to perform self-characterization and self-verification without being removed from the system. The device can report its own characteristics and authenticity status while remaining installed, allowing continuous operation and eliminating the productivity loss associated with device removal for testing.
Solution Approach 2:
The patent creates a universal verification solution where the same embedded sensors and characterization methods can be used regardless of whether the device is in manufacturing, deployment, or field operation phases. This multi-functional approach allows verification at any stage without requiring device removal or specialized external equipment, improving productivity across the entire device lifecycle.
3Measurement precision
If statistical testing of large sample sets is performed, then measurement precision is improved, but loss of time and productivity increase
Solution Approach 1:
The patent extracts the essential verification function from complex statistical sampling of large device sets and concentrates it into individual device-level embedded sensors. Each device carries its own characterization data and can be verified independently through simple sensor readings, eliminating the need for time-consuming statistical testing of large sample populations while maintaining detection accuracy.
Solution Approach 2:
The patent uses copying by embedding replicated sensor constructs and characterization data within each individual device. Instead of testing many devices to statistically determine authenticity, each device contains copied versions of the same sensor constructs and reference characteristics, allowing immediate verification of any single device without requiring population-level statistical analysis.
4Measurement precision
If test appliances are used for initial testing, then measurement precision is improved, but adaptability deteriorates because the same appliance must be used for all subsequent verification
Solution Approach 1:
The embedded sensors make the device self-sufficient for verification, eliminating dependency on specific external test appliances. The device can be characterized and verified using its own internal sensors regardless of what equipment is available, providing adaptability across different environments and phases of the device lifecycle while maintaining measurement precision through consistent sensor-based measurements.
Data Source
AI summary
A programmable device includes a programming interface configured to receive sensor construction information; resources configured to be programmed with the sensor construction information to implement sensors on the programmable device; data processing circuitry configured to execute the sensor construction information causing the sensors to measure and generate sensor information including characteristics of the programmable device; and input/output circuitry configured to output the sensor information to a programmable device categorization system. A programmable device characterization processing system generates categorization models for categorizing programmable devices, and a programmable device categorization system categorizes a programmable device under test (DUT).