Embedded Test Apparatus for High Speed Interface Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Testing high-speed interfaces is challenging without additional components, as existing methods require costly remodeling and complex external testers to vary parameters like voltage and phase, making them inefficient.
Innovation Solution
An integrated circuit with a receiver unit, filter, and processor that applies error correction and adjusts voltage and phase to test input signals, allowing for self-contained testing without external components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external testers are used to vary voltage and phase parameters for testing, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The integrated circuit performs self-testing by using its own power supply to vary voltage and frequency parameters. The receiver unit tests itself under different operating conditions generated by its internal power supply, eliminating the need for complex external testers while maintaining measurement precision through controlled parameter variation.
Solution Approach 2:
The testing function is merged with the normal operational components of the integrated circuit. The power supply that normally operates the receiver unit is also used to vary operating parameters for testing purposes, combining the operational and testing functions into a single integrated system rather than requiring separate external testing equipment.
2Measurement precision
If additional test components are added to production sites, then measurement precision is improved, but ease of manufacture deteriorates
Solution Approach 1:
The integrated circuit includes built-in testing capability that uses its own power supply to vary operating parameters during self-testing. This eliminates the need for additional external test components at the production site, as the device tests itself using internal resources, thereby maintaining measurement precision while preserving ease of manufacture.
Solution Approach 2:
The testing functionality is extracted and integrated directly into the receiver unit itself. Rather than adding external test equipment to the production line, the testing capability is built into the device, allowing it to perform self-tests without requiring external test components or remodeling of the production site.
3Reliability
If error correction is applied in the processor, then reliability is improved, but false error detection increases
Solution Approach 1:
Error correction is applied preliminarily within the processor before the final comparison with the expected value. This preliminary error correction handles obvious errors that occur during signal reception, preventing them from being misinterpreted as functional failures. The corrected signal is then compared with the expected value to determine actual functional correctness, reducing false error reports while maintaining reliability.
Data Source
AI summary
An integrated circuit is provided that comprise a receive unit to be tested for receiving an input signal and storing the input signal at a predetermined point of time. Additionally, it comprises a processor for applying an error correction to the received input signal, for comparing the error corrected signal with an expectation value and for outputting an error message when the filtered input signal does not correspond to the expectation value. A power source supplies the receive unit to be tested with an adjustable voltage and/or and adjustable current. An adjustment unit varies the predetermined point in time and the adjustable voltage respectively the adjustable current.