EMI Absorbing Solder Mask for Semiconductor Package Shielding
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Solution Overview
Problem
Conventional semiconductor packages face challenges in effectively addressing electromagnetic interference (EMI) and radiofrequency interference (RFI) due to their inability to satisfactorily absorb or shield these forms of radiation, which can lead to noise and cross-talk issues as electronic components become smaller and operate at higher frequencies.
Innovation Solution
Incorporating an EMI/RFI absorber material, such as ferrite or silicon carbide, into the solder mask layer or dielectric core of the substrate, combined with a conductive shielding layer, to absorb EMI/RFI radiation and convert it into heat energy, while providing a grounded path for shielding.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If conventional semiconductor packages are used without EMI/RFI absorption materials, then the device structure remains simple and manufacturing cost is low, but electromagnetic interference and radiofrequency interference cause noise and cross-talk issues
Solution Approach 1:
The EMI/RFI absorber material is integrated directly into the existing solder mask layer of the substrate, combining the protective function of the solder mask with the EMI/RFI absorption function in a single layer, thereby reducing overall package complexity while providing interference protection
Solution Approach 2:
The solder mask layer is formulated as a composite material containing EMI/RFI absorber particles (such as ferrite, carbon black, or iron powder) dispersed within the polymer matrix, providing both the protective properties of the solder mask and the electromagnetic absorption properties of the particulate materials
2Object-affected harmful factors
If EMI/RFI shielded packages are implemented at the package level, then interference protection is improved, but manufacturing complexity and cost increase
Solution Approach 1:
The EMI/RFI absorption function is merged into the standard solder mask application process, allowing the absorber material to be applied simultaneously with the solder mask during normal PCB manufacturing operations, eliminating the need for separate shielding component assembly steps
Solution Approach 2:
The solder mask layer is designed to serve multiple functions: providing solder protection, defining component placement areas, and absorbing EMI/RFI interference, thereby eliminating the need for separate dedicated shielding components and simplifying the manufacturing process
3Speed
If electronic components operate at higher frequencies, then data transmission speed and capacity are improved, but electromagnetic radiation and interference increase
Solution Approach 1:
The EMI/RFI absorber materials within the solder mask layer convert the harmful electromagnetic radiation generated by high-frequency operations into heat energy through hysteresis losses and eddy currents, thereby suppressing interference while enabling high-speed data transmission
Solution Approach 2:
The absorber material composition and concentration in the solder mask are optimized to provide effective EMI/RFI absorption across the specific frequency range used by the high-speed components, allowing the system to operate at higher frequencies with controlled electromagnetic emissions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution effectively reduces EMI/RFI interference by 15 dB across a frequency range of 100 MHz to 10 GHz, enhancing the reliability and performance of semiconductor devices by minimizing noise and cross-talk.
Implementation Method 1
an absorbing material for absorbing at least one of EMI and RFI
Implementation Method 2
a conductive layer on the dielectric core, and a solder mask layer on the conductive layer
Data Source
AI summary
A semiconductor device is disclosed including material for absorbing EMI and/or RFI The device includes a substrate (202), one or more semiconductor die (224,225), and molding compound around the one or more semiconductor die (224,225). The material for absorbing EMI and/or RFI may be provided within or on a solder mask layer (210) on the substrate (202). The device may further include EMI/RFI-absorbing material around the molding compound and in contact with the EMI/RFI-absorbing material on the substrate to completely enclose the one or more semiconductor die in EMI/RFI-absorbing material.


