EMIB Package Barrier Layers for Uniform Mixed-Pitch Bump Heights

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Solution Overview

Problem

The integration of multiple dies in electronic packages with non-uniform pitches leads to bump height variations, causing reliability issues during thermal compression bonding and requiring different barrier layer stack-ups to manage varying power requirements across interconnects.

Innovation Solution

The implementation of packaging architectures with barrier layers of varying thickness and composition over pads with non-uniform pitches to correct bump standoff height variations, ensuring minimal height variation and improved reliability through tailored interconnects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple dies are integrated with non-uniform pitches in an electronic package, then functionality and integration density are enhanced, but bump height variation increases causing assembly and reliability issues

Engineering Contradiction:
Improveintegration densityVSAvoidbump height uniformity
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent applies local quality by providing different barrier layer stack-ups at different locations on the package substrate. Specifically, first barrier layers with a first stack-up are provided at first locations, while second barrier layers with a second stack-up are provided at second locations. This allows each region to be optimized for its specific pitch requirements, compensating for the non-uniform pitch variations and achieving uniform bump heights across the entire package.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If different barrier layer stack-ups are used to accommodate non-uniform pitches, then bump height uniformity is improved, but device complexity increases

Engineering Contradiction:
Improvebump height uniformityVSAvoidbarrier layer configuration
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the package substrate into multiple regions with different barrier layer configurations. The substrate is divided into first locations and second locations, each with appropriately tailored barrier layers. This segmentation allows the complex requirement of uniform bump heights across non-uniform pitches to be broken down into manageable regional solutions, making the overall system more controllable and manufacturable.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11955448B2Architecture to manage FLI bump height delta and reliability needs for mixed EMIB pitches
Publication Date: 2024.04.09 INTEL CORP
  • US11955448B2 patent drawing
  • US11955448B2 patent drawing
  • US11955448B2 patent drawing

AI summary

Embodiments disclosed herein include electronic packages. In an embodiment, an electronic package comprises a package substrate and a bridge substrate embedded in the package substrate. In an embodiment, first pads are over the package substrate, where the first pads have a first pitch, and second pads are over the bridge substrate, where the second pads have a second pitch that is smaller than the first pitch. In an embodiment, a barrier layer is over individual ones of the second pads. In an embodiment, reflown solder is over individual ones of the first pads and over individual ones of the second pads. In an embodiment, a first standoff height of the reflown solder over the first pads is equal to a second standoff height of the reflown solder over the second pads.