Emission Lifetime Measurement via Steady-State Excitation
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Solution Overview
Problem
Conventional emission lifetime measuring techniques require short excitation light pulses and complex mathematical procedures for data analysis, making them time-consuming and challenging for measuring mean lifetimes, especially in FLIM applications.
Innovation Solution
The method involves illuminating the sample with excitation light pulses that achieve an equilibrium excited steady-state, allowing for a linear or constant number of electronically excited states, enabling the calculation of mean lifetime from a linear response function section without deconvolution, using equations like τ = t - rf(t)/srf(t) or τ = t - rfi(t)/srfi[t], where t is the time position, rf(t) or rfi(t) is the emission response, and srf(t) or srfi[t] is the slope of the linear response function.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional short excitation light pulses are used, then temporal resolution is improved, but signal-to-noise ratio deteriorates and measurement time increases
Solution Approach 1:
The patent applies periodic pulsed excitation where the excitation light is delivered in repeated pulses rather than continuous illumination. This periodic action allows the system to accumulate signal over multiple excitation cycles while maintaining temporal resolution through the pulsed nature of excitation, thereby improving both measurement precision and productivity
Solution Approach 2:
The patent implements continuous excitation illumination where the excitation light is continuously applied to the sample rather than using intermittent short pulses. This continuity maintains a steady population of excited states, providing continuous emission signal that improves signal-to-noise ratio and enables faster measurements while preserving temporal information through time-resolved detection
2Measurement precision
If conventional deconvolution procedures are used, then accuracy is improved, but computational complexity increases
Solution Approach 1:
The patent extracts the lifetime information directly from the slope of the emission intensity versus time plot without performing full deconvolution of the convolution between excitation pulse and emission decay. By taking out only the essential slope parameter from the linear region, the method achieves accurate lifetime measurement while avoiding the computational complexity of complete deconvolution procedures
Solution Approach 2:
The patent performs preliminary data processing by identifying and isolating the linear region of the emission decay curve before final lifetime calculation. This preliminary action of selecting the appropriate time window and calculating the slope in advance simplifies the overall computational process while maintaining measurement accuracy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the analysis by reducing signal processing complexity, enhancing the signal-to-noise ratio, and enabling faster, more accurate measurement of emission lifetimes with increased sensitivity and photon efficiency, suitable for both single-channel and imaging modalities.
Implementation Method 1
The estimation of emission lifetimes (excited state lifetimes), e.g. based on fluorescence or phosphorescence emission
Implementation Method 2
The estimation of emission lifetimes (excited state lifetimes), e.g. based on fluorescence or phosphorescence emission
Data Source
Figure 1~2
Figure 3~4C
Figure 5A~6
AI summary
An emission lifetime measuring method, in particular for measuring a mean lifetime of electronically excited states of a sample, comprises the steps of illuminating the sample with at least one excitation light pulse, time-resolved detecting an emission response from the sample and creating a temporal detector response function, and calculating the mean lifetime of the electronically excited states on the basis of the detector response function, wherein the at least one excitation light pulse is shaped such that the sample achieves an equilibrium excited steady-state including a linearly increasing or constant number of the electronically excited states, the detector response function has a linear response function section with a constant slope, and the mean lifetime (τ) of the electronically excited states is calculated on the basis of at least one of a time position of the linear response function section relative to a reference time of the at least one excitation light pulse and the slope of the linear response function section. Furthermore, an emission lifetime measuring apparatus (100) is described.