Enable Circuit for Flat Panel Display Testing
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Solution Overview
Problem
The conventional cutoff procedure after testing flat panel displays increases production time and cost by disconnecting test signal input terminals from the display array, which is inefficient and costly.
Innovation Solution
An enable circuit comprising a diode element and a set of transistors is used to connect test signals to the display array only when an enable signal reaches a sufficient voltage level, allowing for testing without disrupting normal operation, thus eliminating the need for the cutoff procedure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the conventional cutoff procedure is used to disconnect test signal input terminals from the display array after testing, then the display array can operate normally without test signal interference, but the production time and cost increase
Solution Approach 1:
The patent implements a dynamic switching mechanism using transistors that can change the electrical connection state between test signal input terminals and display array based on operational mode. During testing, the switching element connects test signals to the display array; during normal operation, it disconnects them. This dynamic switching eliminates the need for permanent cutoff procedures, reducing production time while ensuring reliable normal operation when needed.
Solution Approach 2:
The patent creates a multi-functional circuit structure where the same electrical connection serves dual purposes: during testing, it connects test signals to the display array for functionality verification; during normal operation, it remains connected but inactive. This universal connection structure eliminates the need for separate testing and operational circuits, thereby reducing production time and complexity while maintaining both testing capability and normal operation reliability.
2Reliability
If the conventional cutoff procedure is used to disconnect test signal input terminals from the display array after testing, then the display array can operate normally without test signal interference, but the production cost increases
Solution Approach 1:
The patent implements a dynamic switching mechanism using transistors that can change the electrical connection state between test signal input terminals and display array based on operational mode. During testing, the switching element connects test signals to the display array; during normal operation, it disconnects them. This dynamic switching eliminates the need for permanent cutoff procedures, reducing production time while ensuring reliable normal operation when needed.
Solution Approach 2:
The patent creates a multi-functional circuit structure where the same electrical connection serves dual purposes: during testing, it connects test signals to the display array for functionality verification; during normal operation, it remains connected but inactive. This universal connection structure eliminates the need for separate testing and operational circuits, thereby reducing production time and complexity while maintaining both testing capability and normal operation reliability.
3Productivity
If test signal input terminals are permanently connected to the display array, then testing can be performed at any time, but test signals interfere with normal operation
Solution Approach 1:
The patent implements a dynamic switching mechanism using transistors that can change the electrical connection state between test signal input terminals and display array based on operational mode. During testing, the switching element connects test signals to the display array; during normal operation, it disconnects them. This dynamic switching eliminates the need for permanent cutoff procedures, reducing production time while ensuring reliable normal operation when needed.
Solution Approach 2:
The patent introduces a switching element (transistor) as an intermediary between the test signal input terminals and the display array. This intermediary controls the flow of test signals, allowing them to reach the display array only during testing while blocking them during normal operation. This mediator enables continuous testing capability without causing interference to normal display functionality.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces production time and cost by enabling efficient testing of flat panel displays without affecting their normal operation, as the enable circuit becomes non-functional during normal operation, eliminating the need for the conventional cutoff procedure.
Implementation Method 1
The enable circuit comprises a diode element and a set of transistors. The diode element comprises a first contact and a second contact.
Implementation Method 2
The set of transistors comprises a first contact, a second contact, and a third contact. The second contact of the set of transistors receives a test signal to test the circuit.
Data Source
AI summary
A display apparatus comprises a display array and an enable circuit. The enable circuit comprises a set of diodes and a set of transistors. The diode element comprises a first contact and a second contact. The set of transistors comprises a first contact, a second contact, and a third contact. The first contact of the set of transistors is connected to the display array. The second contact of the set of transistors receives a test signal to test the display array. The third contact of the set of transistors is connected to the first contact of the diode element. The second contact of the diode element receives an enable signal to activate the enable circuit.