Entangled Probe Light Fields for Quantum Data Acquisition

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Solution Overview

Problem

Conventional machine learning methods, including quantum-enhanced approaches, face limitations in data acquisition efficiency and sensitivity, particularly in classifying samples and reducing dimensionality, due to classical measurement methods and direct probing techniques.

Innovation Solution

The system employs entanglement-enhanced variational quantum circuits for generating and processing entangled probe light fields to interact with samples, optimizing their settings through machine learning for improved data acquisition, utilizing a training control module and detectors to measure phase properties and derive classifications or principal components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If classical measurement methods and direct probing techniques are used, then the system is simple to implement, but measurement sensitivity and data acquisition efficiency are limited

Engineering Contradiction:
Improvemeasurement sensitivityVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent introduces entangled probe light fields as an intermediary between the measurement system and the sample. These entangled photons serve as mediators that carry information about the sample's properties while enabling quantum-enhanced sensitivity through their correlated nature, resolving the contradiction between measurement precision and system complexity

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the fundamental parameter of the probe from classical light to quantum-entangled light fields. This parameter change enables the system to achieve quantum-enhanced sensitivity by exploiting quantum correlations, while the variational quantum circuits provide a framework to manage the increased complexity through optimization

Inventive Principle:
Principle #35Parameter changes

2Productivity

If direct probing techniques are used, then the measurement process is straightforward, but data acquisition efficiency and classification performance are suboptimal

Engineering Contradiction:
Improvedata acquisition efficiencyVSAvoidmeasurement process complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by preparing entangled probe light fields before they interact with the sample. The variational quantum circuits pre-process the quantum states to optimize their sensitivity to specific sample properties, enabling more efficient data acquisition during the actual measurement process

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements feedback through the variational quantum circuit framework, where measurement outcomes are used to optimize the circuit parameters iteratively. This feedback mechanism enables the system to learn optimal measurement strategies and improve data acquisition efficiency while managing complexity through adaptive optimization

Inventive Principle:
Principle #23Feedback

3Reliability

If classical data acquisition methods are used, then the system architecture is simple, but sensitivity and error rates in classification tasks are limited

Engineering Contradiction:
Improveclassification accuracyVSAvoidquantum circuit complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent employs a composite approach by combining quantum entangled probe light fields with variational quantum circuits and classical post-processing. This composite system leverages the strengths of quantum mechanics for sensitivity while using classical computation for interpretation, achieving high classification accuracy while managing overall system complexity

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances measurement sensitivity and reduces errors by leveraging entanglement for global property measurement, achieving quantum-enhanced sensitivity and efficiency in data acquisition and classification tasks, while also allowing for indirect probing and dimensionality reduction.

Implementation Method 1

A first variational quantum circuit generates a plurality of entangled probe light fields that interact with a sample

Methodology Applied
Scientific EffectQuantum entanglement:

Implementation Method 2

measuring a phase property of at least one detection light field generated by the second variational quantum circuit

Methodology Applied
Scientific EffectPhase modulation: Phase Modulation

Data Source

PatentUS12067456B2Entanglement-enhanced machine learning with quantum data acquisition
Publication Date: 2024.08.20 THE ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIV OF ARIZONA
  • US12067456B2 patent drawing
  • US12067456B2 patent drawing
  • US12067456B2 patent drawing

AI summary

A system for entanglement-enhanced machine learning with quantum data acquisition includes a first variational circuit that generates a plurality of entangled probe light fields that interacts with a sample and is then processed by a second variational quantum circuit to produce at least one detection light field, a detector is used to measure a property of the at least one detection light field, and the first and second variational quantum circuits are optimized though machine learning. A method for entanglement-enhanced machine learning with quantum data acquisition includes optimizing a setting of a first and second variational quantum circuits, which includes probing a training-set with a plurality of entangled probe light fields generated by the first variational quantum circuit, and measuring a phase property of at least one detection light fields generated by the second variational quantum circuit from the plurality of entangled probe light fields after interaction with the training-set.