Epitaxial Optical Sensor Layout for Low-Leakage Laser Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Optical sensing systems face challenges in accurately measuring the optical properties of light emitted by light sources due to leakage current issues when light sources and detectors are integrated on the same epitaxial chip, which can mask the detector current and reduce measurement accuracy.
Innovation Solution
The implementation of dependently operable epitaxial chips, where light sources and detectors are separated by trenches deeper than conductive layers, allowing for independent operation and reduced leakage current, and utilizing different material properties for light sources and detectors on separate chips to enhance measurement accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If light sources and detectors are integrated on the same epitaxial chip, then device complexity is reduced, but leakage current increases and masks detector current
Solution Approach 1:
The epitaxial chip is segmented into multiple regions separated by trenches. The trenches divide the chip into distinct light source regions and detector regions, preventing electrical leakage while maintaining physical integration on the same substrate. This segmentation allows independent operation of light sources and detectors without electrical interference.
Solution Approach 2:
Trenches filled with dielectric material serve as intermediary structures between light source and detector regions. These trenches act as electrical barriers that block leakage current while allowing optical signals to pass through, thus mediating the interaction between light sources and detectors without direct electrical contact.
2Reliability
If trenches are created to electrically isolate light sources and detectors, then leakage current is reduced, but manufacturing complexity increases
Solution Approach 1:
The trench formation process is merged with the existing epitaxial growth and fabrication工艺流程. The trenches are created using standard semiconductor manufacturing techniques such as photolithography and etching that are already part of the epitaxial chip production process, thereby minimizing additional manufacturing complexity.
3Adaptability or versatility
If multiple epitaxial chips are used for different wavelengths, then wavelength range is expanded, but system complexity increases
Solution Approach 1:
Multiple light source regions with different bandgap materials (emitting different wavelengths) and multiple detector regions are merged onto the same epitaxial chip substrate. This integration allows the system to handle multiple wavelengths simultaneously without requiring separate chips, reducing overall system complexity while expanding wavelength capability.
Solution Approach 2:
The epitaxial chip is designed with multi-functionality, containing both light source regions and detector regions that can operate across different wavelength ranges. This universal design allows a single chip to perform multiple functions (light emission at different wavelengths and detection at different wavelengths) that would traditionally require multiple specialized chips.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate measurement of optical properties by minimizing leakage current and allowing for broader wavelength ranges and improved efficiency in optical sensing systems, particularly in applications requiring precise detection of multiple laser outputs.
Implementation Method 1
the detector can be configured for measuring the optical properties of light emitted by a light source
Data Source
Figure 1
Figure 2A
Figure 2B
AI summary
A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.