Epitaxial Template Surface Preparation for Quantum Devices

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Solution Overview

Problem

The existing methods for preparing epitaxial templates from bulk substrates introduce defects due to cutting and processing, leading to impurities and structural defects in the surface of single crystal wafers, which hinder the growth of high-quality epitaxial layers, especially for quantum components that require extremely low defect densities.

Innovation Solution

A method involving a single crystal wafer with a defined miscut angle and temperature-controlled heating to achieve a minimal step density and specific surface reconstruction, ensuring only one orientation of the surface reconstruction, thereby reducing defects and enhancing the quality of epitaxial layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If the single crystal wafer is cut from the bulk substrate using conventional sawing, grinding and polishing processes, then the wafer can be obtained for further processing, but atomic scale and mesoscopic defects are introduced into the surface of the single crystal wafer

Engineering Contradiction:
Improvewafer productionVSAvoidsurface defect density
Core Design Contradiction:
Ease of manufactureVSManufacturing precision

Solution Approach 1:

The bulk substrate is pre-cut with a precise miscut angle (0.1-5 degrees) relative to the crystal plane before wafer fabrication. This preliminary angular adjustment ensures that the final wafer surface, after conventional processing, maintains a controlled deviation from the ideal crystal plane, minimizing the introduction of defects while still allowing standard manufacturing processes to be used.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the wafer surface is heated to 1200°C in an oxygen or nitrogen atmosphere to prepare as an epitaxial template, then the surface can be cleaned and activated, but impurities from the atmosphere and readsorbed contaminations from ambient conditions lead to defects in the surface

Engineering Contradiction:
Improveepitaxial template qualityVSAvoidsurface impurity contamination
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The heating and surface preparation process is conducted in an inert atmosphere (vacuum or inert gas) instead of oxygen or nitrogen atmosphere. This prevents the introduction of atmospheric impurities and readsorbed contaminations during the high-temperature heating process, maintaining surface cleanliness and preventing defect formation while still achieving the desired surface activation and impurity removal.

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

3Manufacturing precision

If the wafer is cut exactly along the crystal plane to minimize steps, then the surface structure is ideal, but it is currently technically impossible to cut the bulk substrate directly along a plane of the crystal structure

Engineering Contradiction:
Improvesurface step densityVSAvoidcutting feasibility
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

Instead of attempting to cut exactly along the crystal plane (which is technically impossible), the invention changes the parameter by introducing a controlled miscut angle (0.1-5 degrees) relative to the crystal plane. This parameter adjustment makes the cutting process feasible using conventional techniques while still achieving minimal surface step density and maintaining ideal surface structure for epitaxial growth.

Inventive Principle:
Principle #35Parameter changes

4Reliability

If the surface atoms are allowed to rearrange to form a reconstructed surface, then a chemically uniform and structurally periodic template is created, but multiple energetically equivalent surface reconstructions with different orientations can form, leading to domain boundaries

Engineering Contradiction:
Improvesurface structural periodicityVSAvoidsurface orientation uniformity
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The invention introduces asymmetry by applying a controlled miscut angle (0.1-5 degrees) to the wafer surface relative to the crystal plane. This asymmetric orientation breaks the symmetry of the surface reconstruction process, causing atoms to preferentially arrange in a single orientation rather than forming multiple energetically equivalent domains. The miscut creates a directional preference that eliminates domain boundaries and ensures uniform surface orientation across the entire wafer surface.

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in a defect-free epitaxial template with a single surface reconstruction orientation, significantly reducing defects in the epitaxial layers and enabling the production of high-quality electronic components, including quantum devices with extended qubit relaxation times and coherence times.

Implementation Method 1

heating the substrate to a temperature at which the surface atoms and/or the surface molecules can migrate along the surface to form an arrangement with a minimal step density

Methodology Applied
Scientific EffectSurface migration: Diffusion

Implementation Method 2

heating the substrate to a temperature at which atoms or molecules of the substrate constituent having the highest sublimation rate may leave the surface

Methodology Applied
Scientific EffectSublimation: Sublimation

Data Source

PatentUS20240287707A1Method of preparing a surface of a single crystal wafer as an epitaxial template, epitaxial template and device
Publication Date: 2024.08.29 MAX PLANCK GESELLSCHAFT ZUR FOERDERUNG DER WISSENSCHAFTEN EV
  • US20240287707A1 patent drawing
  • US20240287707A1 patent drawing
  • US20240287707A1 patent drawing

AI summary

The invention relates to a method of preparing a surface of a bulk substrate as an epitaxial template, to an epitaxial template and to a device comprising such an epitaxial template.