Error Detection Circuit Using Segmented Data Processing
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Solution Overview
Problem
Conventional error detection circuits in semiconductor circuits require a large logic circuit area and experience increased logic skew due to the need to perform error detection operations on all data inputted from external systems, making them inefficient.
Innovation Solution
An error detection circuit with a selection unit that sequentially selects primary and secondary data groups based on control signals, performing error detection operations and generating output signals, which are then compared to external error detection signals to determine data errors, thereby reducing the circuit area and logic skew.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If error detection operation is performed on all pieces of data inputted from external system, then error detection accuracy is improved, but logic circuit area and logic skew increase
Solution Approach 1:
The data inputted from external system is divided into multiple pieces (first piece, second piece, third piece). Error detection operations are performed separately on each piece rather than on all data simultaneously, reducing the logic circuit area required at any given time while maintaining comprehensive error detection coverage.
Solution Approach 2:
Error detection operations are performed in advance on individual data pieces as they are inputted, and the results are stored. This preliminary error detection allows the system to prepare detection results before final comparison, reducing the peak logic circuit area needed for simultaneous processing of all data.
2Reliability
If error detection operation is performed on all pieces of data inputted from external system, then error detection accuracy is improved, but logic skew increases
Solution Approach 1:
The error detection process is segmented into multiple sequential operations on different data pieces. By processing data in smaller units with intermediate storage of results, the overall logic skew is reduced compared to processing all data through a single long critical path.
Solution Approach 2:
Error detection results for individual data pieces are obtained in advance and stored before final comparison. This preliminary action allows subsequent operations to use pre-computed results, reducing the critical path time and logic skew in the overall error detection process.
Data Source
AI summary
An error detection circuit may include a selection unit that sequentially selects a primary data group and a secondary data group according to a first control signal and generates an output signal; a first operation unit that performs an error detection operation on the output signal and outputs a preliminary error operation signal; a storage unit that latches the preliminary error operation signal and output a latched signal according to a second control signal; a second operation unit that performs an error detection operation on a previous preliminary error operation signal outputted from the storage unit and a current preliminary error operation signal outputted from the first operation unit and generates an internal error operation signal; and a comparison unit that compares the internal error operation signal with an external error operation signal and outputs a result of the comparison as an error detection signal.