Error Scrub Control Circuit for Semiconductor Modules
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
As data transmission speeds in semiconductor devices increase, so does the likelihood of errors, necessitating improved error detection and correction mechanisms beyond traditional error detection codes (EDC) and error correction codes (ECC).
Innovation Solution
A semiconductor module with a controller and error scrub control circuit that performs error scrub operations during read operations on memory chips, using Reed-Solomon codes for error correction, allowing for efficient error detection and correction without requiring additional time for separate error scrub operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data transmission speed is increased, then productivity is improved, but reliability deteriorates due to increased error probability
Solution Approach 1:
The patent combines the error scrub operation with the read operation by performing error correction on data while it is being read from memory chips. The controller executes error correction codes (ECC) on data during the read process itself, rather than requiring a separate error scrub phase. This merging of operations maintains high data transmission speeds while continuously correcting errors, thus preserving reliability without sacrificing productivity.
2Reliability
If separate error scrub operations are performed, then reliability is improved, but loss of time increases due to additional operational time required
Solution Approach 1:
The patent merges the error scrub operation with the read operation by performing error correction on data while it is being read from memory chips. The controller executes error correction codes (ECC) on data during the read process itself, rather than requiring a separate error scrub phase. This merging of operations maintains high data transmission speeds while continuously correcting errors, thus preserving reliability without sacrificing productivity.
Solution Approach 2:
The error correction process operates continuously during every read operation rather than being performed periodically in separate scrub phases. The controller continuously applies ECC to data as it is read from memory chips, ensuring that error correction is an ongoing process that never interrupts the normal read workflow. This continuous operation eliminates idle time while maintaining data integrity.
Data Source
AI summary
A semiconductor device includes a flag generation circuit and a write operation circuit. The flag generation circuit generates an error scrub flag if an error scrub operation is performed. The write operation circuit controls a write operation in response to the error scrub flag. The error scrub operation includes an internal read operation for outputting read data from a cell array, a data correction operation for correcting an error included in the read data to generate corrected data, and an internal write operation for storing the corrected data into the cell array.