ESD Detection Circuit for Digital ICs
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Solution Overview
Problem
Conventional ESD detection methods for digital integrated circuits are passive and inefficient, often requiring external main controller resources, leading to delayed detection and potential long-term malfunction due to ESD overruns.
Innovation Solution
An ESD detection apparatus and method that includes a check read control module and a check calculation module to perform cyclic redundancy checks on data values from a flip-flop set module, determining ESD overruns without occupying external main controller resources, allowing for real-time detection and interrupt generation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If passive ESD detection method using external main controller is used, then ESD overrun can be detected, but it occupies external main controller resources and has low detection efficiency
Solution Approach 1:
The circuit performs self-detection of ESD overruns through the check calculation module that automatically monitors trigger values without requiring external main controller intervention. The circuit detects its own error state by comparing current trigger values with expected values, enabling autonomous error detection and improving detection efficiency while reducing external resource occupation.
Solution Approach 2:
The detection function is segmented from the external main controller and implemented as an independent check calculation module within the circuit. This module separately handles ESD detection tasks, allowing simultaneous operation of detection and other main controller functions, thereby improving overall system productivity and detection efficiency.
2Reliability
If passive ESD detection method is used, then ESD overrun can be detected, but detection is not real-time and circuit may operate in error state for long time
Solution Approach 1:
The check calculation module continuously monitors trigger values by performing check calculations on every read operation of the flip-flop set module. This continuous detection mechanism ensures real-time identification of ESD overruns, preventing the circuit from operating in error states for extended periods and enabling immediate corrective action.
Solution Approach 2:
The circuit performs preliminary check calculations on trigger values before they are used for circuit operations. By pre-validating the correctness of trigger values through comparison with expected values, the system can detect ESD overruns before they cause further errors, reducing the time loss associated with error propagation.
3Reliability
If external main controller resources are used for ESD detection, then detection can be performed, but other operations are affected and efficiency is reduced
Solution Approach 1:
The ESD detection function is segmented into a separate check calculation module that operates independently from the main controller. This module reads flip-flop values and performs check calculations in parallel with other main controller operations, eliminating resource conflicts and ensuring that ESD detection does not interfere with other system operations.
Solution Approach 2:
The check calculation module serves multiple functions: it reads flip-flop values, performs check calculations, compares results, and generates error signals. This multi-functional design consolidates detection capabilities within a single module, reducing the need for additional external resources and minimizing impact on other operations.
Data Source
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AI summary
Disclosed are an ESD detection apparatus and method applied to digital integrated circuit, and an integrated circuit. The apparatus includes: a check read control module, configured to initiate a read operation for a flip-flop set module; and a check calculation module, configured to receive a data value sent by the flip-flop set module according to the read operation, perform check calculation according to the data value, and determine, according to comparison of a result of the check calculation and a history check calculation result, whether an ESD overrun is present. According to the present application, a simple circuit structure is employed to detect the ESC overrun, without occupying resources of an external main controller. As such, other operations may not be affected, the efficiency is improved, and the ESD overrun may be detected in real time.