ESD Diode Abnormality Detection Circuit Using LED Indication

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Solution Overview

Problem

Current methods for detecting abnormalities in ESD protection diodes in chips are not intuitive and require significant manpower, as they often rely on manual measurement with hand-held tools, leading to low detection efficiency.

Innovation Solution

A chip abnormality detecting circuit that includes a test power, a connector, a power switching circuit, and an abnormal signal detecting circuit, which automatically detects the reverse cutoff characteristic of the ESD protection diode by forming a current loop and using a light emitting diode to indicate detection results, eliminating the need for hand-held tools.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If manual measurement with hand-held multimeter is used to detect ESD protection diode abnormalities, then detection can be performed with simple equipment, but detection efficiency is low and requires significant manpower

Engineering Contradiction:
Improvedetection efficiencyVSAvoiddetection system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The detection circuit automatically performs detection without manual intervention. The test power source, power switching circuit, and abnormal signal detecting circuit work together to automatically apply test voltage, measure current, and determine diode abnormalities, eliminating the need for manual multimeter operations and significantly improving detection efficiency

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces manual mechanical measurement operations with an automated electronic detection system. The hand-held multimeter and manual measurement process are substituted by an electronic circuit that automatically measures electrical characteristics and determines abnormalities, transforming a manual mechanical process into an automated electronic system

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Ease of operation

If hand-held multimeter and measuring tools are used for detection, then equipment requirements are simple, but significant manpower is required and detection efficiency is low

Engineering Contradiction:
Improveoperation simplicityVSAvoiddetection efficiency
Core Design Contradiction:
Ease of operationVSProductivity

Solution Approach 1:

The detection circuit automatically performs detection without manual intervention. The test power source, power switching circuit, and abnormal signal detecting circuit work together to automatically apply test voltage, measure current, and determine diode abnormalities, eliminating the need for manual multimeter operations and significantly improving detection efficiency

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system prepares the detection environment in advance by connecting the chip to the detection circuit through the connector, with the test power source and measurement circuits already configured. When detection is needed, the system is ready to immediately perform automated measurement without requiring manual setup or tool preparation

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables automatic and intuitive detection of ESD protection diode characteristics, improving detection efficiency and allowing for batch testing without the need for manual measurement tools.

Implementation Method 1

using a light emitting diode to indicate detection results

Methodology Applied
Scientific EffectLight emitting diode: Light Emitting Diode

Data Source

PatentUS11099233B2Chip abnormality detecting circuit and chip abnormality detecting device
Publication Date: 2021.08.24 HKC CORP LTD
  • US11099233B2 patent drawing
  • US11099233B2 patent drawing
  • US11099233B2 patent drawing

AI summary

The present disclosure discloses a chip abnormality detecting circuit and a chip abnormality detecting device. The circuit includes an abnormal signal detecting circuit configured to detect a reverse cutoff characteristic of an electrostatic discharge (ESD) protection diode of the chip to be detected, and output a corresponding detection signal.