Electrostatic Discharge Evaluation Device for Display Drivers
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Solution Overview
Problem
Conventional methods for evaluating electrostatic discharge breakdown withstand in semiconductor devices, such as those used in large display panels, are inadequate as they fail to accurately recreate the high-energy failure modes encountered in production processes, particularly in liquid crystal displays where multiple source and gate lines are involved, leading to insufficient evaluation of electrostatic discharge withstand voltage.
Innovation Solution
An electrostatic discharge withstand voltage evaluating device and method that includes a system with a first and second connecting section for supplying pulse electric charge to input and output terminals, allowing for the recreation of failure modes by grounding specific terminals and connecting output terminals in a common section, thereby simulating the high-energy discharge scenarios encountered in large display panels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional evaluation methods (HBM, MM, CDM models) are used, then the evaluation process is simple and well-established, but they fail to accurately recreate high-energy failure modes in large display panels with multiple source and gate lines
Solution Approach 1:
The evaluation system is segmented into multiple independent connecting sections (first connecting section, second connecting section, common connecting section) that can be independently configured. Each section can be connected to different terminals (input terminals, output terminals) of the semiconductor device, allowing flexible recreation of various discharge scenarios without requiring a completely complex integrated system.
Solution Approach 2:
The system employs dynamic switching mechanisms where connecting sections can be selectively connected or disconnected from different terminals based on the specific failure mode being evaluated. This dynamic reconfiguration allows the same hardware system to simulate multiple discharge scenarios (HBM, MM, CDM, and high-energy display panel scenarios) without physical redesign.
2Measurement precision
If the number of connecting sections and connecting methods are increased to accurately simulate high-energy discharge scenarios in large display panels, then the measurement precision improves, but the device complexity and operation difficulty increase
Solution Approach 1:
Each connecting section is designed with multi-functionality, capable of being connected to different types of terminals (input terminals, output terminals) and serving multiple evaluation purposes. The first connecting section can connect to output terminals for charge injection, the second connecting section can connect to input terminals for discharge detection, and the common connecting section provides a shared reference point, allowing a single system to handle various evaluation configurations.
Solution Approach 2:
The common connecting section acts as an intermediary element that mediates between the first connecting section (charge injection side) and the second connecting section (discharge detection side). This intermediary provides a stable reference connection and simplifies the overall system architecture by providing a common ground or reference point that all other sections can relate to, reducing operational complexity.
3Adaptability or versatility
If conventional breakdown models (HBM, MM, CDM) are used, then the evaluation method is well-established and easy to implement, but they cannot evaluate the specific high-energy failure modes occurring in production processes of large display panels
Solution Approach 1:
The system enables preliminary configuration of different connecting scenarios before actual discharge events occur. By pre-establishing the first connecting section for charge injection and the second connecting section for discharge detection, the system can accurately capture and evaluate the specific high-energy failure modes that occur during production processes, rather than relying on pre-defined conventional models that may not match actual failure conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively recreates failure modes in semiconductor devices, enabling a more accurate evaluation of electrostatic discharge breakdown withstand voltage, particularly in display driving semiconductor devices, by simulating the high-energy discharge scenarios relevant to large display panels, thus improving the reliability of the evaluation process.
Implementation Method 1
an electrostatic discharge breakdown test measures the electrostatic discharge breakdown withstand of the electronic device by preparing a model for recreating how the electrostatic discharge breakdown occurs
Implementation Method 2
a common connecting section being connectable to the plurality of the output terminals of the measuring object device, and causing the plurality of output terminals to be electrically connected to each other
Data Source
AI summary
In one embodiment of the present invention, an electrostatic discharge withstand voltage evaluating device includes: an application device, including a first connecting section and a second connecting section, for supplying pulse electric charge, the first connecting section being connectable to one or whole terminal (s) of one of input terminals and output terminals of a source driver, and supplying electric charge to the source driver, the second connecting section being connectable to one or whole terminal(s) of the other one of the input terminals and the output terminals, and enabling said one or whole terminal(s) of the other one of the input terminals and the output terminals to be grounded; and a common connecting section being connectable to the plurality of output terminals of the source driver, and causing the plurality of output terminals to be electrically connected to each other, wherein the output terminals of the source driver are connected, via the common connecting section, to one of the first connecting section and the second connecting section. Therefore, the electrostatic discharge withstand voltage evaluating device can more successfully recreate how a failure occurs in a semiconductor device and can evaluate an electrostatic discharge breakdown withstand of the semiconductor device.