ESD Network Analysis by Common Resistance Removal
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Solution Overview
Problem
Current methods for analyzing electrostatic discharge (ESD) networks in semiconductor devices are inefficient and inaccurate due to the inability to accurately calculate and exclude common resistance, which degrades the accuracy of ESD network analysis.
Innovation Solution
A method and system for analyzing ESD networks by calculating the common resistance using predetermined equations and performing network analysis by excluding this resistance, allowing for accurate and efficient verification of ESD protection circuits in semiconductor devices.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If common resistance is included in ESD network analysis, then the analysis can be performed with simpler methodology, but the accuracy of ESD protection verification deteriorates
Solution Approach 1:
The patent extracts and removes the common resistance component from the ESD network analysis. By calculating the common resistance separately using the formula Rcommon = (Rui + Rvi - Ruv)/2 and then excluding it from the network analysis, the methodology achieves both simplicity in calculation and high accuracy in ESD protection verification. This extraction principle allows the analysis to focus only on the unique resistance components that truly affect ESD protection performance.
2Measurement precision
If comprehensive ESD network analysis is performed including all resistance components, then verification accuracy improves, but analysis time and computational complexity increase
Solution Approach 1:
By extracting and removing the common resistance component that does not contribute to ESD protection verification, the patent significantly reduces analysis time while maintaining high verification accuracy. The common resistance calculation is performed once using the straightforward formula, and then this pre-calculated value is excluded from subsequent network analyses, avoiding redundant computations.
Solution Approach 2:
The patent changes the approach by introducing a parameter transformation that converts the complex network analysis problem into a simpler form. By defining and removing the common resistance parameter, the analysis transitions from considering all resistance components to considering only the meaningful components, thereby reducing computational complexity and analysis time without sacrificing accuracy.
3Productivity
If common resistance is removed from analysis, then analysis efficiency improves, but complexity of resistance calculation increases
Solution Approach 1:
The patent applies parameter changes by introducing a mathematical transformation that simplifies the resistance calculation. Instead of performing complex network analysis to determine common resistance, the patent uses the parameter transformation formula Rcommon = (Rui + Rvi - Ruv)/2, which converts a complex analysis problem into a simple arithmetic calculation, thereby improving efficiency while keeping the calculation method straightforward.
Data Source
AI summary
In an example method of analyzing an electrostatic discharge (ESD) network, input data characterizing a semiconductor device is received. The semiconductor device includes an input/output (I/O) pad, an ESD protection circuit, and at least one functional circuit. A common resistance of the ESD protection circuit is calculated based on the input data and using a plurality of resistances and at least one predetermined equation. The plurality of resistances are associated with the I/O pad, the ESD protection circuit, and the at least one functional circuit. A network analysis is performed on the semiconductor device by excluding the common resistance.