ESD Probe Adapter With Relay Isolation For Test Equipment Protection
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Solution Overview
Problem
Existing methods for testing electronic devices' susceptibility to electrostatic discharge (ESD) are prone to damaging test equipment and may not deliver accurate simulated ESD pulses due to impedance issues from test equipment connections.
Innovation Solution
An adapter system for ESD probe tips that includes a conductor attachment device with a filter to isolate test equipment from the simulated ESD pulse, using a relay to disconnect test equipment during pulse transmission, and a controller to manage the connection states, minimizing impedance effects and protecting test equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If test equipment is connected simultaneously to the electronic device during ESD pulse transmission, then testing can be performed, but the test equipment may be damaged by the high voltage pulse
Solution Approach 1:
The relay is pre-configured and positioned in the circuit path between the ESD simulator and test equipment. Before the ESD pulse is generated, the relay is in a state that allows the pulse to pass through to the electronic device under test. The system is prepared in advance to automatically disconnect the test equipment from the ESD pulse path when needed, enabling continuous operation without manual intervention.
Solution Approach 2:
A relay is introduced as an intermediary component between the ESD simulator and the test equipment. The relay acts as a controlled switch that mediates the connection, allowing the ESD pulse to reach the device under test while protecting the test equipment from damage. The relay's switching action isolates the test equipment from the high voltage pulse path.
2Measurement precision
If test equipment is connected to the electronic device during ESD pulse transmission, then testing can be performed, but the simulated ESD pulse accuracy is degraded due to loading effects
Solution Approach 1:
The relay is pre-configured and positioned in the circuit path between the ESD simulator and test equipment. Before the ESD pulse is generated, the relay is in a state that allows the pulse to pass through to the electronic device under test. The system is prepared in advance to automatically disconnect the test equipment from the ESD pulse path when needed, enabling continuous operation without manual intervention.
Solution Approach 2:
A relay is introduced as an intermediary component between the ESD simulator and the test equipment. The relay acts as a controlled switch that mediates the connection, allowing the ESD pulse to reach the device under test while protecting the test equipment from damage. The relay's switching action isolates the test equipment from the high voltage pulse path.
3Measurement precision
If the ESD simulator is disconnected and test equipment connected during ESD pulse transmission, then accurate pulsing is achieved, but the testing process time increases
Solution Approach 1:
The relay is pre-configured and positioned in the circuit path between the ESD simulator and test equipment. Before the ESD pulse is generated, the relay is in a state that allows the pulse to pass through to the electronic device under test. The system is prepared in advance to automatically disconnect the test equipment from the ESD pulse path when needed, enabling continuous operation without manual intervention.
Solution Approach 2:
The relay provides dynamic switching capability that automatically changes the circuit configuration based on the ESD pulse timing. During the ESD pulse transmission, the relay connects the electronic device to the ESD simulator while isolating the test equipment. Between pulses, the relay switches to connect the test equipment to the electronic device for testing. This dynamic switching eliminates manual connection changes and reduces testing cycle time.
Data Source
AI summary
Adapters for electrostatic discharge probe tips are disclosed herein. An embodiment of the adapter includes an attachment device that is attachable to the tip of the probe. A first conductor is affixed to the attachment device so that the first conductor contacts the tip when the attachment device is attached to the tip of the probe. A second conductor extends between the first electrical conductor and a point external to the attachment device.


