ESD Protection Circuit Ramp-Down Flyback Voltage

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Solution Overview

Problem

As integrated circuits (ICs) become smaller, they are more susceptible to damage from electrostatic discharge (ESD) during fabrication, assembly, and operation, and existing ESD protection circuits can cause permanent over-voltage damage due to flyback voltage overshoot when disabled suddenly, especially with inductive power supplies.

Innovation Solution

An ESD protection circuit that differentiates ESD events from normal power on based on supply rise time, featuring a controlled disable state with a ramp-down driver to gradually release the ESD clamp, reducing or eliminating flyback voltage by gradually ramping down current after a predetermined protection period.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the ESD clamp is suddenly disabled to quickly protect the IC, then the response time is fast, but flyback voltage overshoot occurs causing permanent over-voltage damage

Engineering Contradiction:
Improveresponse timeVSAvoidflyback voltage overshoot
Core Design Contradiction:
SpeedVSObject-affected harmful factors

Solution Approach 1:

The ESD clamp disable process is transformed from a static sudden switch-off to a dynamic controlled ramp-down process. The ramp-down driver gradually reduces the clamp current over a predetermined time period, allowing the inductive power supply current to decrease smoothly without generating harmful flyback voltage overshoot, thus resolving the contradiction between fast response and voltage spike prevention.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The circuit performs preliminary detection of ESD events and activates the clamp before the actual damage occurs. Additionally, it preliminarily prepares for the disable phase by implementing a controlled ramp-down sequence, ensuring that the transition from active protection to normal operation does not cause harmful voltage spikes.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If the ESD clamp is continuously active to provide constant protection, then the protection reliability is high, but power consumption increases and normal operation is interfered with

Engineering Contradiction:
Improveprotection reliabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The ESD clamp operates in periodic cycles rather than continuously. It activates only when ESD events are detected, maintains protection for a predetermined duration, then gradually disables. This periodic operation ensures reliable protection during critical moments while minimizing power consumption during normal operation, resolving the contradiction between constant protection and energy efficiency.

Inventive Principle:
Principle #19Periodic action

3Duration of action of moving object

If the ESD clamp is rapidly disabled to reduce protection duration, then the power consumption is reduced, but flyback voltage damage occurs

Engineering Contradiction:
Improveprotection durationVSAvoidover-voltage damage
Core Design Contradiction:
Duration of action of moving objectVSObject-affected harmful factors

Solution Approach 1:

The disable process is made dynamic through controlled ramp-down instead of abrupt termination. The ramp-down driver adjusts the clamp current gradually over time, allowing the protection duration to be limited while avoiding the harmful effects of sudden disablement, thus resolving the contradiction between limiting protection duration and preventing over-voltage damage.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Effectively protects ICs from ESD by preventing permanent over-voltage damage through controlled disablement of the ESD clamp, reducing or eliminating flyback voltage overshoot, thus enhancing the reliability of smaller ICs.

Implementation Method 1

Electrostatic discharge (ESD) can occur when a static charge conducts between two surfaces that have different electrical potentials

Methodology Applied
Scientific EffectElectrostatic discharge: Electrostatic Discharge

Implementation Method 2

When the power supply is also inductive, a flyback voltage overshoot at the sudden release of the ESD clamp can result in permanent over voltage-related device damage

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentUS11201467B2Reduced flyback ESD surge protection
Publication Date: 2021.12.14 QORVO US INC
  • US11201467B2 patent drawing
  • US11201467B2 patent drawing
  • US11201467B2 patent drawing

AI summary

Reduced flyback electrostatic discharge (ESD) surge protection is disclosed. An ESD protection circuit differentiates ESD events from normal power on based on supply rise time. During an ESD protection cycle, the ESD protection circuit briefly clamps a supply on an identified ESD edge to limit and protect an electronic device from high voltage and/or current. In some cases, a surge condition may occur as the ESD protection circuit becomes disabled, such as in the presence of a fast rise time power supply. When the power supply is also inductive, a flyback voltage overshoot at the sudden release of the ESD clamp can result in permanent over voltage-related device damage. An exemplary ESD protection circuit includes a controlled disable state which reduces or eliminates flyback during such a surge by gradually ramping down current from the ESD protection cycle.