ESD Signal Generator for Multi-Terminal Device Testing
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Solution Overview
Problem
Current ESD stress testing methods for electronic devices are inadequate as they often require multiple pulses applied to various terminals to fully characterize device behavior, particularly for transistors, which existing transmission line pulse systems fail to address effectively.
Innovation Solution
An apparatus and method that generate signals with pulse widths in the ESD time range, including a test signal and an auxiliary signal, delayed and synchronized to simulate realistic ESD events, allowing for comprehensive stress testing of electronic devices by applying these signals to appropriate terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If transmission line pulse systems are used to apply stress pulses, then the pulse width can be controlled, but the system cannot apply multiple synchronized pulses to various terminals simultaneously
Solution Approach 1:
The system divides the pulse generation function into multiple independent pulse generators, each capable of generating pulses for specific terminals. This segmentation allows simultaneous application of multiple pulses to different terminals while maintaining manageable system complexity through modular architecture.
Solution Approach 2:
The pulse generators are designed with universal functionality to can generate different pulse types (TLP, ESD, bipolar) and can be configured for different terminals. This multi-functionality enables the system to apply multiple pulses to various terminals without requiring separate dedicated generators for each terminal.
2Measurement precision
If multiple pulses are applied to characterize device behavior, then comprehensive testing is achieved, but the timing synchronization becomes difficult
Solution Approach 1:
The system incorporates timing control mechanisms that monitor and adjust pulse delivery timing across all terminals. This feedback ensures precise synchronization of multiple pulses, enabling accurate behavioral characterization while minimizing timing delays through real-time adjustment.
Solution Approach 2:
The system pre-configures pulse sequences and timing parameters before actual testing begins. By preparing the timing synchronization in advance and pre-positioning pulses in the correct temporal sequence, the system achieves precise multi-terminal pulse application without experiencing timing delays during the actual test execution.
Data Source
AI summary
An apparatus and a method for generating signals for ESD stress testing an electronic device are disclosed. In an embodiment the apparatus is configured to receive a source signal including a source pulse, delay the source pulse to generate a test signal including a test pulse with a pulse width in an ESD time range and generate an auxiliary signal including an auxiliary pulse with a pulse width in the ESD time range.