eSWIR Thermal Imaging System for Object Identification

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Solution Overview

Problem

Current infrared imaging systems face challenges in effectively identifying objects using reflected illumination in mid wavelength infrared (MWIR) or long wavelength infrared (LWIR) bands due to poor reflectance at these wavelengths, limiting their ability to image both emissive heat and reflected light simultaneously.

Innovation Solution

An imaging system that detects wavelengths in both MWIR or LWIR and extended short wave infrared (eSWIR) bands, using a light source to illuminate objects with eSWIR light and an identify circuit to classify objects based on spectral characteristics of reflected light, allowing for identification of objects through reflection or absorption in the eSWIR range, which can enhance emissive heat emission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If standard thermal imaging systems are used to detect MWIR or LWIR wavelengths, then emissive heat can be imaged, but reflected light illumination is ineffective due to poor reflectance at these wavelengths

Engineering Contradiction:
Improveobject identification capabilityVSAvoidreflected light detection reliability
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The imaging system is segmented into multiple detection channels: one for MWIR/LWIR thermal emission detection and another for eSWIR reflected light detection. This allows each wavelength band to be optimized for its specific function (thermal imaging vs. reflected light imaging), resolving the contradiction between imaging emissive heat and reflected light simultaneously

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The imaging system is designed to perform multiple functions using a single integrated platform: it can detect both thermal emission in MWIR/LWIR bands and reflected light in eSWIR band. The detector array and optical system are configured to handle multiple wavelength bands, enabling the system to identify objects through both emissive and reflective characteristics

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If a single wavelength band detector is used, then the system is simpler, but it cannot simultaneously image both emissive heat and reflected light

Engineering Contradiction:
Improvemulti-wavelength detection capabilityVSAvoiddetector system complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

Multiple wavelength band detection capabilities are merged into a single detector array system. The detector is designed to detect photons across multiple infrared wavelength bands (eSWIR, MWIR, LWIR) simultaneously, combining what would traditionally require separate imaging systems into one unified device

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system adds spectral dimensionality by detecting multiple wavelength bands simultaneously. Instead of using separate physical systems for different wavelength bands, the invention extends detection into the spectral domain, allowing multi-wavelength imaging through a single detector array with appropriate optical filtering and wavelength selection

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the simultaneous imaging of emissive heat and reflected light, improving object identification by utilizing specific wavelengths not commonly used, thereby overcoming limitations of standard thermal imaging systems and enhancing detection capabilities.

Implementation Method 1

spectral characteristics of light returned from the object detected by the detector

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 2

identification of objects through reflection or absorption in the eSWIR range

Methodology Applied
Scientific EffectAbsorption: Absorption (EM radiation)

Implementation Method 3

infrared imaging up to 2.5 μm images reflected light from an object and infrared imaging above 3.0 μm images emitted light from an object

Methodology Applied
Scientific EffectThermal radiation: Thermal Radiation

Implementation Method 4

detector configured to detect wavelengths in a first infrared wavelength band and a second infrared wavelength band

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS20240369414A1Thermal imaging including an extended short wave infrared light source to identify an object
Publication Date: 2024.11.07 LIGHTPATH TECH INC
  • US20240369414A1 patent drawing
  • US20240369414A1 patent drawing
  • US20240369414A1 patent drawing

AI summary

An infrared imaging system includes a detector configured to detect wavelengths in a first infrared wavelength band and a second infrared wavelength band, shorter than the first infrared wavelength band, a light source configured to output light in the second infrared wavelength band to an object, and an identify circuit configured to identify the object based on spectral characteristics of light returned from the object detected by the detector. The second infrared wavelength band is an extended short wavelength infrared band.