Semiconductor Etching Composition for Rate-Selectivity Balance

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Solution Overview

Problem

Existing etching processes for semiconductor devices face challenges in achieving effective etch rates, selectivity to adjacent layers, and storage stability while minimizing surface residue, which can impact device reliability and integration.

Innovation Solution

An etching composition comprising an oxidizing agent, an accelerator, and an ammonium salt, with specific compounds represented by Formulae 1 and 2, is used to control etching selectivity and rates, ensuring faster etching of certain regions of the metal-containing layer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If conventional etching compositions are used to achieve good etch rates, then etching speed is improved, but etching selectivity to adjacent layers deteriorates

Engineering Contradiction:
Improveetch rateVSAvoidetching selectivity
Core Design Contradiction:
SpeedVSManufacturing precision

Solution Approach 1:

The patent modifies the chemical composition parameters of the etching solution by incorporating specific organic acids (formic acid, acetic acid, propionic acid, or butyric acid) at controlled concentrations (0.1-10 wt%). This parameter change enables simultaneous achievement of high etch rates and improved selectivity to adjacent layers, resolving the trade-off between etching speed and precision.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If aggressive etching conditions are applied to increase productivity, then manufacturing efficiency is improved, but surface residue increases

Engineering Contradiction:
Improvemanufacturing efficiencyVSAvoidsurface residue
Core Design Contradiction:
ProductivityVSObject-generated harmful factors

Solution Approach 1:

The patent adjusts chemical parameters by adding organic acids that modify the etching mechanism to reduce surface residue formation. The specific concentration range (0.1-10 wt%) of organic acids enables aggressive etching conditions to be applied while maintaining clean surfaces, thus improving productivity without generating harmful surface residue.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If etching composition is stored for extended periods to ensure process continuity, then manufacturing reliability is improved, but storage stability deteriorates

Engineering Contradiction:
Improveprocess continuityVSAvoidstorage stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

The patent incorporates organic acids that prevent decomposition and precipitation during storage, ensuring the etching composition maintains its effectiveness over extended periods. This enables continuous manufacturing operations with reliable process performance while maintaining storage stability, resolving the contradiction between process continuity and composition stability.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The composition provides controlled etching selectivity and rates, maintaining stability at high temperatures, enhancing the manufacturing process efficiency of semiconductor devices.

Implementation Method 1

an oxidizing agent

Methodology Applied
Scientific EffectOxidation: Oxidation

Implementation Method 2

an accelerator

Methodology Applied
Scientific EffectCatalysis: Catalysis

Data Source

PatentUS20250250683A1Etching composition, method of etching metal-containing layer by using the same, and method of manufacturing semiconductor device by using the etching composition
Publication Date: 2025.08.07 SAMSUNG ELECTRONICS CO LTD
  • US20250250683A1 patent drawing
  • US20250250683A1 patent drawing
  • US20250250683A1 patent drawing

AI summary

An etching composition may include an oxidizing agent, an accelerator, an ammonium salt, and an aqueous solvent, wherein the accelerator may include one or more compounds represented by Formula 1, and the ammonium salt may include at least one compound having a structure in which at least one of hydrogen ions (H+) of a hydroxyl group (*—OH) or a thiol group (*—SH) included in the accelerator is substituted with an ammonium cation (NH4+):Formula 1 is as described in the present specification.