EUV Source Debris Control via Laser Steering and Buffer Gas

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Solution Overview

Problem

The generation of extreme ultraviolet (EUV) radiation in plasma-based systems results in undesirable by-products such as out-of-band radiation, high energy ions, and debris, which degrade the optical elements and reduce their useful lifetime, and also lead to target material deposition on the vessel walls, affecting the efficiency and longevity of EUV sources.

Innovation Solution

A source control loop is established using temperature sensors to optimize debris flux and deposition while maintaining EUV generation conditions, by adjusting the laser targeting and target material positioning within the plasma chamber, utilizing a laser steering system and target material delivery system, and incorporating an EUV radiation metrology system to monitor and control the interaction of laser radiation and target material.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If laser radiation is used to generate EUV radiation by irradiating target material, then EUV radiation is produced, but debris and target material are deposited on optical elements and vessel walls, degrading their performance and reducing lifetime

Engineering Contradiction:
ImproveEUV radiation generationVSAvoiddebris deposition on optical elements
Core Design Contradiction:
PowerVSObject-affected harmful factors

Solution Approach 1:

A buffer gas (hydrogen or deuterium) is introduced into the vacuum chamber as an intermediary substance between the laser irradiation region and the optical elements. This buffer gas absorbs and slows down the high-energy debris particles generated during laser-induced plasma formation, preventing them from directly impacting and degrading the optical elements. The buffer gas thus mediates the interaction between the plasma generation process and the optical components, protecting the latter while allowing the former to continue.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Duration of action of stationary object

If buffer gas is introduced to protect optical elements from debris, then optical element lifetime is extended, but EUV radiation efficiency may be reduced due to gas absorption

Engineering Contradiction:
Improveoptical element lifetimeVSAvoidEUV radiation absorption by buffer gas
Core Design Contradiction:
Duration of action of stationary objectVSLoss of energy

Solution Approach 1:

The system dynamically adjusts the buffer gas pressure parameters to optimize the balance between protection and efficiency. By controlling the buffer gas pressure within specific ranges (e.g., 0.1-10 mbar), the system ensures sufficient debris mitigation while minimizing EUV radiation absorption. This parameter optimization allows the buffer gas to provide adequate protection without excessively compromising the EUV generation efficiency.

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If laser beam is steered to adjust target material flux direction, then debris deposition is minimized, but system complexity increases

Engineering Contradiction:
Improvedebris deposition on vessel wallsVSAvoidlaser steering system complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The laser beam steering system is made dynamic and adjustable, allowing real-time modification of the beam direction and focal point. This dynamic capability enables the system to adapt to varying debris patterns and target material flux directions, optimizing debris mitigation without requiring a completely complex fixed infrastructure. The adjustability provides flexibility in managing debris deposition while maintaining reasonable system complexity.

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach extends the lifetime of EUV sources and optical elements by minimizing debris deposition and maintaining the directionality of target material flux, effectively managing by-products and ensuring optimal EUV production.

Implementation Method 1

the required plasma can be produced by using a laser beam to irradiate a target material having the required line-emitting element

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Implementation Method 2

creating a highly ionized plasma with electron temperatures of several 10's of eV

Methodology Applied
Scientific EffectPlasma generation: Plasma

Implementation Method 3

H2 gas is introduced into the vacuum chamber to slow down the energetic debris (ions, atoms, and clusters) of target material created by the plasma. The debris is slowed down by collisions with the gas molecules.

Methodology Applied
Scientific EffectGas collisions:

Implementation Method 4

a near-normal-incidence mirror (often termed a 'collector mirror' or simply a 'collector') is positioned to collect, direct, and, in some arrangements, focus at least a portion of the radiation

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS10490313B2Method of controlling debris in an EUV light source
Publication Date: 2019.11.26 ASML NETHERLANDS BV
  • US10490313B2 patent drawing
  • US10490313B2 patent drawing
  • US10490313B2 patent drawing

AI summary

Disclosed is an EUV system in which a source control loop is established to maintain and optimize debris flux while not unduly affecting optimum EUV generation conditions. One or more temperature sensors, e.g., thermocouples may be installed in the vessel to measure respective local gas temperatures. The respective local temperature as measured by the one or more thermocouples can be used as one or more inputs to the source control loop. The source control loop may then adjust the laser targeting to permit optimization of debris generation and deposition while not affecting EUV production, thus extending the lifetime of the source and its collector.