EUV Material Supply Filter with Through Holes
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Solution Overview
Problem
In the production of extreme ultraviolet (EUV) light for photolithography, existing methods face challenges in effectively removing non-target particles from the target material mixture, which can lead to debris and impurities in the plasma, affecting the quality of the EUV light produced.
Innovation Solution
A dual-filter system is employed, where the first filter, which can be sintered or mesh, and the second filter, with uniformly-sized through holes, are used in series to remove non-target particles from the target material mixture before it reaches the target location, with the second filter having a significantly reduced exposed surface area compared to a sintered filter of equivalent transverse extent, and made of materials like glass or tungsten to enhance compatibility and filtration efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a sintered filter is used to remove non-target particles, then filtration effectiveness is improved, but the exposed surface area increases causing higher pressure drop
Solution Approach 1:
The patent changes the geometric parameters of the filter by transitioning from a sintered structure to a manufactured structure with through holes. Specifically, the exposed surface area is reduced by a factor of at least 100 while maintaining filtration effectiveness through the through hole configuration, thereby reducing pressure drop.
Solution Approach 2:
The patent replaces the traditional sintered mechanical filtration structure with a manufactured filter featuring through holes. This substitution allows for controlled pore sizes and significantly reduced surface area, achieving both effective particle removal and minimized pressure drop.
2Productivity
If a filter with large exposed surface area is used, then particle removal efficiency is improved, but the filter becomes more prone to clogging and pressure build-up
Solution Approach 1:
The patent fundamentally changes the surface area parameter by reducing it by at least a factor of 100 compared to conventional sintered filters. This parameter change maintains particle removal efficiency while dramatically reducing the filter's susceptibility to clogging and pressure build-up.
3Stability of the object's composition
If uniformly-sized through holes are used in the second filter, then flow uniformity is improved, but manufacturing precision requirements increase
Solution Approach 1:
The patent employs manufactured through holes instead of sintered pores, enabling precise control over hole dimensions. This manufacturing approach allows for uniformly-sized holes with tight tolerances, ensuring consistent flow distribution while achieving the required manufacturing precision through modern fabrication techniques.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dual-filter system effectively reduces non-target particles, minimizing debris and improving the purity of the EUV light produced, ensuring better plasma characteristics and EUV light quality by blocking impurities and maintaining a negligible pressure drop across the filters.
Implementation Method 1
a first filter through which the target mixture is passed; a second filter through which the target mixture is passed
Data Source
AI summary
A filter is used in a target material supply apparatus and includes a sheet having a first flat surface and a second opposing flat surface, and a plurality of through holes. The first flat surface is in fluid communication with a reservoir that holds a target mixture that includes a target material and non-target particles. The through holes extend from the second flat surface and are fluidly coupled at the second flat surface to an orifice of a nozzle. The sheet has a surface area that is exposed to the target mixture, the exposed surface area being at least a factor of one hundred less than an exposed surface area of a sintered filter having an equivalent transverse extent to that of the sheet.


