EUV Laser Pulse Timing Feedback Control

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Solution Overview

Problem

In extreme ultraviolet (EUV) lithography systems, the synchronization of target droplets with the excitation laser pulses is crucial for efficient plasma generation, but mechanical and electrical drifts cause misalignment, leading to reduced EUV radiation intensity and dose errors during lithography exposure.

Innovation Solution

A feedback control system adjusts the time delay between pre-pulse and main pulse of the excitation laser based on EUV energy measurements, using an energy detector and actuator to maintain optimal droplet illumination, ensuring precise synchronization and alignment of laser pulses with target droplets.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If laser pulses are synchronized with target droplet generation and movement, then EUV radiation intensity is improved, but mechanical and electrical drifts cause misalignment leading to reduced intensity

Engineering Contradiction:
ImproveEUV radiation intensityVSAvoidsynchronization stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent employs a feedback control system that continuously monitors the position of target droplets and adjusts the timing of laser pulses accordingly. Sensors detect droplet position and this information is fed back to the laser control system, which dynamically adjusts the pulse timing to maintain optimal synchronization despite mechanical and electrical drifts, thereby preserving EUV radiation intensity

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system transitions from static, pre-programmed laser timing to dynamic, real-time adjustment of pulse timing. The laser synchronization system continuously adapts its timing parameters based on actual droplet position measurements, making the system flexible and responsive to changing conditions, thus maintaining optimal synchronization under varying operational conditions

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If precise synchronization is maintained to improve EUV energy production, then dose accuracy is improved, but drift causes dose errors

Engineering Contradiction:
Improvedose accuracyVSAvoidalignment consistency
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The feedback control system monitors actual droplet positions and laser pulse timing, comparing them against desired parameters. When deviations are detected, the system automatically adjusts timing to correct the misalignment, ensuring that the EUV energy delivered to the photomask maintains accurate dosimetry despite drift conditions

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system performs preliminary measurements of droplet position and velocity before the main laser pulse arrives. This advance information is used to predict and compensate for potential misalignment, allowing the control system to pre-adjust timing parameters to ensure accurate dose delivery

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the stability and efficiency of the laser-produced plasma (LPP) EUV source by maintaining optimal EUV energy production, reducing dose errors and improving the accuracy of EUV lithography processes.

Implementation Method 1

A feedback control system adjusts the time delay between pre-pulse and main pulse of the excitation laser based on EUV energy measurements

Methodology Applied
Scientific EffectLaser heating: Laser

Implementation Method 2

a feedback control system adjusts the time delay between pre-pulse and main pulse of the excitation laser based on EUV energy measurements

Methodology Applied
Scientific EffectPlasma radiation: Plasma

Data Source

PatentUS11153959B2Apparatus and method for generating extreme ultraviolet radiation
Publication Date: 2021.10.19 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US11153959B2 patent drawing
  • US11153959B2 patent drawing
  • US11153959B2 patent drawing

AI summary

An apparatus for generating extreme ultraviolet (EUV) radiation comprises a droplet generator, an excitation laser source, an energy detector, and a feedback controller. The droplet generator is configured to generate target droplets. The excitation laser is configured to generate a pre-pulse and a main pulse to convert the target droplets to plasma by heating. The energy detector is configured to measure a variation in EUV energy generated when the target droplets are converted to plasma. The feedback controller is configured to adjust a time delay between a subsequent pre-pulse and main pulse generated by the excitation laser based on the variation in EUV energy generated by a given main pulse.