Evaluator Module for Dynamic Electronic Device Binning
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Solution Overview
Problem
Current electronic device testing systems face inefficiencies in binning processes, particularly in final test operations, where devices are sorted based on provisional binning assignments defined by test programs, which may not account for dynamic or statistical analysis of device performance, leading to suboptimal bin allocation and increased engineering effort for algorithm deployment across multiple products and testers.
Innovation Solution
A system and method that introduce an Evaluator module to define permanent binning assignments for electronic devices, which may differ from provisional assignments, utilizing algorithms like Dynamic Part Average Testing (D-PAT) and data feed-forward methods to dynamically assess device performance and allocate bins based on statistical and manufacturing data, thereby optimizing binning without modifying existing test programs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If provisional binning assignments defined by test programs are used, then binning can be performed with existing test infrastructure, but bin allocation is suboptimal and does not account for dynamic device performance analysis
Solution Approach 1:
An Evaluator module is introduced as an intermediary component between the test program and the binning decision. The Evaluator receives test data from the test program and independently determines permanent binning assignments based on statistical analysis, while the test program continues to execute without modification. This mediator enables advanced binning logic without increasing test program complexity.
Solution Approach 2:
The Evaluator module autonomously performs statistical analysis and binning decisions without requiring external intervention or test program modification. It self-manages the analysis of device performance data, comparison against thresholds, and determination of permanent bin assignments, thereby improving bin allocation accuracy while maintaining system simplicity.
2Productivity
If algorithms are deployed across multiple products and testers, then binning optimization can be achieved, but engineering effort increases for algorithm deployment and maintenance
Solution Approach 1:
The Evaluator module is designed as a universal component that can process test data from multiple different products and tester types through a standardized interface. It implements generic statistical analysis algorithms that adapt to different device characteristics without requiring product-specific customization, enabling broad deployment across diverse manufacturing lines while minimizing engineering effort.
Solution Approach 2:
The Evaluator uses configurable parameters and thresholds that can be adjusted for different products and device types without changing the underlying algorithm structure. This parameter-based configuration approach allows rapid deployment across multiple products by simply adjusting numerical values rather than rewriting algorithms, significantly reducing engineering deployment time.
3Reliability
If permanent binning assignments are defined by Evaluator rather than test program, then dynamic and statistical binning is enabled, but separation between test execution and binning decision increases system complexity
Solution Approach 1:
The binning system is segmented into distinct functional components: the test program responsible for device testing and data collection, and the Evaluator module responsible for statistical analysis and binning decisions. This segmentation separates concerns and enables each component to specialize in its function, improving binning accuracy while managing complexity through modular architecture.
Solution Approach 2:
The Evaluator acts as an intermediary layer between test execution and binning decisions, receiving standardized test data and outputting permanent bin assignments. This intermediary structure maintains clear interfaces and data flow while enabling sophisticated statistical analysis, thereby improving reliability without creating unmanageable system complexity.
Data Source
AI summary
A method of sorting an electronic device includes receiving first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data. The method also includes defining a permanent binning assignment for the electronic device based at least in part on applying a first algorithm and a second algorithm to the first data, the first algorithm and the second algorithm being different. The method further includes outputting the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.