Evaporation Mask Layout for Accurate Display Panel Offset Measurement
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The preparation of display panels with multiple evaporation masks for sub-pixels of different colors is complex and costly due to the need for precise metal masks, which increases project costs.
Innovation Solution
A display panel design with staggered sub-pixels and offset marks formed using a single evaporation mask, allowing for accurate offset measurement and reduced mask usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple evaporation masks are used for preparing sub-pixels of different colors, then offset measurement accuracy is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent merges the functions of multiple evaporation masks into a single mask by integrating multiple sub-pixel opening patterns (for different colors) and multiple offset mark opening patterns into one mask structure. This allows all sub-pixels and offset marks to be prepared simultaneously in one evaporation process, eliminating the need to manage multiple separate masks while maintaining measurement accuracy
Solution Approach 2:
The single evaporation mask is designed with universal functionality to serve multiple purposes: it contains sub-pixel opening patterns for different color sub-pixels (red, green, blue) and offset mark opening patterns for offset measurement. This multi-functional design replaces what would traditionally require multiple specialized masks
2Measurement precision
If multiple precise metal evaporation masks are used, then offset measurement accuracy is improved, but manufacturing cost increases
Solution Approach 1:
The patent combines multiple expensive precise metal masks into a single mask structure, reducing the total number of masks from multiple to one. This merging significantly reduces material costs, manufacturing costs, and inventory costs while maintaining the capability to measure offsets accurately through the integrated offset mark patterns
3Manufacturing precision
If multiple evaporation masks are used for different colors, then sub-pixel preparation precision is improved, but process complexity increases
Solution Approach 1:
The patent merges multiple evaporation processes that would require sequential use of different masks into a single evaporation process using one integrated mask. The mask contains all necessary opening patterns for different color sub-pixels and offset marks, allowing simultaneous preparation in one step, thus reducing process complexity while maintaining precision
Solution Approach 2:
The single evaporation mask is pre-designed with all necessary opening patterns (sub-pixel patterns for different colors and offset mark patterns) before the evaporation process. This preliminary design allows the complex multi-color sub-pixel preparation to be executed in one straightforward evaporation step without requiring complex sequential mask changes
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the preparation process and reduces costs by enabling accurate offset measurement with fewer evaporation masks, thereby lowering overall expenses.
Implementation Method 1
an organic material is deposited on a substrate disposed above an evaporation source through the high-temperature evaporation
Data Source
AI summary
Provided are a display panel, an evaporation mask, a display device and a preparation method. A display region of the display panel includes multiple first sub-pixels and multiple second sub-pixels, and the multiple first sub-pixels and the multiple second sub-pixels have a same shape and a same size and are different in color; a pattern composed of the multiple first sub-pixels is at least partially consistent with a pattern composed of the multiple second sub-pixels, and mutually consistent patterns are staggered in a first direction, and denotes a staggered vector in the first direction; a non-display region includes a first offset mark A1 and a second offset mark A2, denotes a vector connecting a center of the first offset mark A1 and a center of the second offset mark A2, and the vector satisfies: =+; where denotes a first preset deviation.