Event-Based Particle Sorting Verification Across Multiple Focal Planes
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Solution Overview
Problem
Conventional methods for confirming correct sorting of microparticles in flow cytometers, such as cell sorters, are time-consuming due to the use of visual observation and frame-type cameras, leading to errors in sorting cells into wells, which necessitate lengthy confirmation operations.
Innovation Solution
A particle analysis system employing an imaging unit with a scanning mechanism to detect luminance changes and measure states at multiple focal positions, utilizing an event-based vision sensor (EVS) to quickly verify correct sorting without increasing device cost or size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If visual observation and frame-type camera are used to confirm correct sorting of microparticles, then sorting accuracy can be verified, but the confirmation operation time becomes excessively long
Solution Approach 1:
The patent replaces the mechanical frame-type camera system with an event-based vision sensor (EBVS) that detects luminance changes asynchronously. This substitution eliminates the need for continuous frame capture and mechanical scanning, enabling rapid verification of particle sorting without the time penalty of traditional frame-based systems.
Solution Approach 2:
The patent changes the detection parameter from continuous frame capture to event-based luminance change detection. By monitoring only when luminance changes occur rather than capturing all frames, the system achieves accurate sorting verification while dramatically reducing the time required for confirmation operations.
2Measurement precision
If frame-type camera with shallow focal depth is used for sorting confirmation, then individual particle detection is possible, but multiple focal positions require sequential scanning increasing operation time
Solution Approach 1:
The patent implements continuous event detection across multiple focal positions simultaneously. Rather than sequentially scanning through focal planes with a frame camera, the EBVS continuously monitors luminance changes at all focal positions, eliminating idle scanning time while maintaining precise particle detection capability.
Solution Approach 2:
The patent adds the time dimension to the detection process by using asynchronous event timing. Each luminance change event is timestamped, allowing the system to reconstruct three-dimensional particle information (x, y, z coordinates) from temporal data, thereby eliminating the need for mechanical focal plane scanning.
3Productivity
If high-speed imaging is implemented to reduce confirmation time, then sorting verification speed improves, but device complexity and cost increase
Solution Approach 1:
The patent employs a relatively simple and cost-effective event-based vision sensor instead of expensive high-speed frame cameras. The EBVS uses straightforward luminance threshold comparison logic that is computationally inexpensive, achieving high-speed sorting verification without the complex hardware and processing requirements of traditional high-speed imaging systems.
Solution Approach 2:
The patent extracts only the essential information needed for sorting verification - the timing and position of luminance change events - rather than processing complete image frames. This extraction approach dramatically reduces computational complexity and hardware requirements while maintaining high verification speed.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system significantly reduces the time required for confirming correct sorting of microparticles while maintaining reliability, reducing errors and device complexity.
Implementation Method 1
an imaging unit configured to detect, as an event, a luminance change of light from a particle in a container
Data Source
AI summary
An operation time is shortened. A particle analysis system according to an embodiment includes an imaging unit (13) configured to detect, as an event, a luminance change of light from a particle in a container, a first scanning unit (14) configured to scan a focal position of the imaging unit in a depth direction of the container, and a processing unit (103) configured to measure a state in the container based on the events detected at a plurality of the focal positions of the imaging unit by scanning of the first scanning unit.