Integrated Event Process Display for Operator Intent Analysis

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Solution Overview

Problem

Existing methods for analyzing operator operations in control systems, such as distributed control systems, struggle to clearly correlate operator intentions with changes in process values, making it difficult to improve plant operations effectively.

Innovation Solution

An event process data integration and analysis apparatus that generates unit operation bands and process trend charts associated by time, allowing for a clear understanding of operator intentions and process value changes, and includes features like operation trend charts and combined unit operation bands to enhance user convenience.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If individual event log operations are analyzed separately, then detailed operation records are obtained, but it becomes difficult to understand overall operator intentions and patterns

Engineering Contradiction:
Improveoperation analysis precisionVSAvoidoperator intention information
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent combines multiple individual event log operations into grouped operation sequences that represent complete operator intentions. By merging related operations that occur within a time window and involve the same device or process, the system preserves detailed operation records while simultaneously presenting consolidated views of operator intentions, thus resolving the contradiction between detailed analysis and overall pattern understanding.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent introduces a temporal dimension by organizing operations into time-based sequences and grouping them according to their temporal relationships. This dimensional transformation allows the system to maintain detailed operation data while presenting aggregated views that reveal operator intentions across time, enabling both precise individual operation analysis and comprehensive pattern recognition.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If detailed operating procedures are documented in SOP, then operation quality can be standardized, but flexibility for handling unique situations is reduced

Engineering Contradiction:
Improveoperation quality consistencyVSAvoidoperator flexibility
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent implements feedback mechanisms that capture actual operator operations and use them to refine and update standard operating procedures. By continuously analyzing real operation data and comparing it with documented SOPs, the system identifies gaps and improvements, allowing SOPs to evolve while maintaining operational standards. This feedback loop enables both consistency through documented procedures and adaptability through continuous improvement based on actual practice.

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If multiple operations are performed to adjust process values gradually, then precise control is achieved, but analysis complexity increases

Engineering Contradiction:
Improveprocess value control precisionVSAvoidanalysis system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent segments the analysis process into distinct levels: individual operation detection, operation grouping by device and time window, and sequence formation based on temporal relationships. This hierarchical segmentation allows the system to handle multiple granular operations for precise process control while managing analysis complexity through structured organization, where each segmentation level processes data at an appropriate granularity without overwhelming the overall system.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS11308666B2Event process data integration and analysis apparatus, and event process data integration and analysis method
Publication Date: 2022.04.19 YOKOGAWA ELECTRIC CORP
  • US11308666B2 patent drawing
  • US11308666B2 patent drawing
  • US11308666B2 patent drawing

AI summary

An event process data integration and analysis apparatus of the present disclosure includes an integrated display output interface. The integrated display output interface generates, based on unit operation data, a unit operation band for each device among a plurality of devices, the unit operation band representing an operation intention of an operator and being arranged in a time series. The integrated display output interface generates, based on process data, a process trend chart for each device, the process trend chart representing a change over time in a process value. The integrated display output interface generates an integrated display that displays the unit operation band and the process trend chart associated by time.