Excitonic Optical Imaging for Non-Destructive IC Depth Profiling
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Solution Overview
Problem
Current non-destructive imaging techniques for integrated circuits and three-dimensional objects lack effective methods to accurately determine depth information without damaging the objects, especially for counterfeit detection and barcode reading.
Innovation Solution
A non-destructive method utilizing interrogating beams of light on three-dimensional objects with excitonic materials, capturing their optic responses, and computing distances between underlying surfaces and excitonic layers, which can be used to construct topography images and detect counterfeits by comparing these distances to product specifications.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional imaging techniques are used to obtain depth information of integrated circuits, then the imaging process can be performed, but the techniques cannot accurately determine depth information without damaging the objects
Solution Approach 1:
The patent replaces physical contact-based measurement methods with optical field-based measurement. By using excitonic materials that respond to light fields, the system obtains depth information through optical responses rather than mechanical probing, thereby avoiding object damage while achieving accurate depth measurement.
Solution Approach 2:
The patent introduces excitonic materials as an intermediary layer between the light source and the integrated circuit. These materials convert depth information into measurable optical responses (intensity, emission rate, diffusion), enabling non-destructive depth profiling through the mediator's photophysical properties.
2Measurement precision
If excitonic materials are used for non-destructive imaging, then depth information can be obtained, but the system complexity increases due to material deposition requirements
Solution Approach 1:
The patent utilizes changes in photophysical parameters (intensity, emission rate, diffusion) of excitonic materials in response to light field variations. By measuring these parameter changes, the system extracts depth information without requiring complex structural modifications to the integrated circuit itself.
Solution Approach 2:
The excitonic material layer serves multiple functions: it acts as a depth-sensitive probe, a transducer converting depth to optical signal, and a non-destructive interface layer. This multi-functionality reduces the need for separate components, thereby managing system complexity while achieving accurate depth measurement.
3Object-affected harmful factors
If photo physical properties are used for imaging, then non-destructive topography mapping can be achieved, but the detection reliability must be validated against product specifications
Solution Approach 1:
The patent implements a feedback mechanism by comparing measured distances between the excitonic layer and underlying surfaces against product specifications. This feedback loop enables validation of detection reliability, distinguishing authentic from counterfeit integrated circuits based on whether the measured parameters match expected specifications.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate, non-destructive imaging and depth profiling of integrated circuits and three-dimensional barcodes, effectively distinguishing authentic from counterfeit items by analyzing the optical responses of excitonic materials to light, enhancing detection reliability and information storage capacity.
Implementation Method 1
capturing, using an imaging device, optic response of the one or more materials having excitonic properties to the one or more interrogation beams
Implementation Method 2
the emission intensity (and rate) from a direct band gap semiconductor can be affected by its proximity to a mirror. This is a result of change in the local density of optical states due to constructive or destructive interference
Data Source
AI summary
The present disclosure relates to non-destructive methods for collecting data from three-dimensional objects. Method include directing one or more interrogating beams of light towards a surface of a three-dimensional object, where the three-dimensional object includes one or more underlying surfaces, and one or more materials having excitonic properties are disposed on the surface of the three-dimensional object; capturing, using an imaging device, optic response of the one or more materials having excitonic properties to the one or more interrogation beams; and computing, using the imaging device, a distance between the one or more underlying surfaces and the one or more materials having excitonic properties, where the optic response of the one or more materials having excitonic properties is a function of the distance between the one or more materials having excitonic properties and the one or more underlying surfaces.