Extender Strip for Inaccessible Memory Card Slot Testing
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Solution Overview
Problem
The inaccessibility of memory card slots within electronic devices, such as cellular telephones, when positioned beneath covers or batteries, hinders fault testing and signal exchange testing between the memory card and the host device, as existing testing equipment cannot access these internal slots during normal device operation.
Innovation Solution
A system utilizing a flat flexible cable with contact pads and a rigid member for alignment, connected to a test assembly that includes a debug header for a logic analyzer or oscilloscope, allowing signal exchange and testing between the host device and an external memory card, even when the memory card slot is buried within the device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If the memory card slot is positioned within the interior of the device to reduce form factor, then device compactness is improved, but accessibility to the slot for testing purposes deteriorates
Solution Approach 1:
The device is segmented into functional components: the memory card slot remains embedded in the device interior, while a separate flexible cable assembly with external connector provides the testing interface. This segmentation allows the slot to stay compact within the device while the testing functionality is accessed externally through the cable connection to the logic analyzer.
Solution Approach 2:
A flexible cable assembly acts as an intermediary between the internal memory card slot and external testing equipment. The cable includes contact pads that mate with the slot's contact pads, transmitting signals between the embedded slot and the logic analyzer, thereby enabling testing without requiring physical access to the slot itself.
2Volume of moving object
If the memory card slot is positioned beneath the battery or cover to save space, then device compactness is improved, but ability to perform fault testing deteriorates
Solution Approach 1:
The flexible cable assembly serves as an intermediary that bridges the gap between the inaccessible internal slot and external testing equipment. By mating the cable's contact pads with the slot's contact pads, signals can be transmitted to and from the embedded slot, enabling fault detection and measurement without requiring physical access to the slot location.
Solution Approach 2:
The physical mechanical access requirement is replaced by an electrical signal transmission system. Instead of requiring physical access to the slot for testing, the flexible cable transmits electrical signals between the embedded slot and the logic analyzer, substituting mechanical accessibility with electrical connectivity.
3Reliability
If the memory card slot is made inaccessible during normal operation to maintain device integrity, then device reliability is improved, but testing and debugging capability deteriorates
Solution Approach 1:
The flexible cable assembly acts as an intermediary that enables testing functionality without compromising device integrity. The cable connects to the slot's contact pads electrically, allowing testing signals to pass through while the slot remains physically embedded and protected within the device during normal operation.
Solution Approach 2:
The system changes the state of the memory card slot from completely inaccessible to conditionally accessible. During normal operation, the slot remains embedded and protected. During testing, the flexible cable is connected to the contact pads, changing the accessibility parameter while maintaining device structural integrity.
Data Source
AI summary
A system and method are disclosed for testing operation of a memory card within an electronic host device. The system includes a flat flexible cable, or strip, for electrically coupling between the memory card slot in a host device and a test assembly. The test assembly may have a card slot for accepting an external memory card, and a debug header for receiving a cable connected to a debug apparatus such as a logic analyzer and/or an oscilloscope.