External Projection Device for Microscope Structured Illumination

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Solution Overview

Problem

Conventional optical microscopes face challenges with photobleaching in fluorescence microscopy, limited flexibility in component substitution or upgrading, and suboptimal Point Spread Function, leading to reduced image quality and increased computational complexity in deconvolution microscopy.

Innovation Solution

A projection device that attaches externally to the photo-port of a widefield microscope, incorporating a beam splitter and pattern mask for directing illumination and projecting patterns onto the object plane, allowing for improved pattern projection and image quality through structured illumination and targeted light sources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional widefield illumination is used, then the microscope can operate with simple built-in light paths, but photobleaching occurs and image resolution is limited

Engineering Contradiction:
Improveimage resolutionVSAvoidphotobleaching
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

The illumination is segmented into multiple discrete light sources (laser diodes) arranged in an array, each capable of being independently controlled. This segmentation allows selective illumination of specific regions or patterns on the specimen, improving resolution through structured illumination while reducing overall photobleaching by illuminating only necessary areas.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system employs periodic modulation of the light sources to project moving patterns (such as line scans or grid patterns) across the specimen. This periodic action enables structured illumination microscopy techniques that enhance resolution beyond the diffraction limit while using lower overall light intensity, thereby reducing photobleaching.

Inventive Principle:
Principle #19Periodic action

2Manufacturing precision

If complex configurations of lenses and lasers are assembled by the manufacturer, then resolution may be improved, but flexibility in component substitution or upgrading is reduced

Engineering Contradiction:
ImproveresolutionVSAvoidflexibility in component substitution
Core Design Contradiction:
Manufacturing precisionVSAdaptability or versatility

Solution Approach 1:

The microscope system is designed with a universal platform that can accommodate multiple types of light sources (different wavelengths and types of laser diodes) and various optical components. The modular architecture with standardized mounting interfaces allows the same basic system to perform multiple functions and be upgraded with improved components as they become available, maintaining both high resolution and flexibility.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system incorporates dynamically controllable light sources that can be adjusted in intensity, wavelength, and activation patterns through software control. This dynamic capability allows the microscope to adapt to different imaging requirements and be upgraded by simply changing control parameters or swapping individual components without redesigning the entire system.

Inventive Principle:
Principle #15Dynamics

3Manufacturing precision

If grids or diaphragms are inserted into built-in illumination paths, then pattern projection may be achieved, but the efficiency of the built-in fluorescence source is diminished

Engineering Contradiction:
Improvepattern projection accuracyVSAvoidfluorescence source efficiency
Core Design Contradiction:
Manufacturing precisionVSLoss of energy

Solution Approach 1:

The system replaces mechanical insertion of grids or diaphragms into the illumination path with a digital control system that selectively activates specific laser diodes in an array. This substitution eliminates the need for physical masks that block light, thereby maintaining the efficiency of the light source while achieving precise pattern projection through electronic control of which light sources are activated.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enhances image resolution and flexibility by reducing photobleaching, improving the Point Spread Function, and simplifying deconvolution microscopy, while maintaining the use of existing light sources for various microscopy techniques.

Implementation Method 1

a beam splitter located within the illumination path for directing the illumination path through the photo-port interface onto the object plane of the optical microscope and for directing the object plane of the optical microscope onto the detector plane

Methodology Applied
Scientific EffectLight reflection and transmission: Reflection

Implementation Method 2

incorporating a beam splitter and pattern mask for directing illumination and projecting patterns onto the object plane

Methodology Applied
Scientific EffectOptical projection: Lens

Implementation Method 3

a light source interface for receiving of illumination from a light source, the illumination defining an illumination path

Methodology Applied
Scientific EffectLight emission: Light

Data Source

PatentUS8089691B2Projection device for patterned illumination and microscopy
Publication Date: 2012.01.03 QUORUM TECH
  • US8089691B2 patent drawing
  • US8089691B2 patent drawing
  • US8089691B2 patent drawing

AI summary

A projection and detector device that attaches externally to the photo-port of a widefield microscope. The device includes a light source interface for receiving of illumination from a light source, the illumination defining an illumination path. A pattern mask is located within the illumination path for projecting one or a plurality of objects, structures, or patterns onto a sample located at the object plane of the optical microscope. The pattern mask may be used with structured illumination microscopy (SIM) to project a moving striped optical grid pattern or Ronchi Ruling onto the sample at the object plane in either fluorescence or reflected brightfield imaging. A mechanical or digital diaphragm may also be used, for techniques such as Fluorescence Recovery After Photobleaching (FRAP), fluorescence photoactivation, and targeted illumination. A computer linked with a charged coupled device (CCD) camera may be used to capture images for storage and further post-processing.