Eye Surgery Microscope Ametropia Measurement via Retinal Image Position

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Solution Overview

Problem

Existing eye surgery microscopes with wavefront sensors for measuring ametropia are expensive, require significant space, and are sensitive to stray light, making them difficult to integrate and use effectively.

Innovation Solution

An eye surgery microscope design that directs a measurement light beam onto the retina to form an image in a measurement module, where the position of the image plane is determined to calculate ametropia based on refractive power, using optics and a controller to adjust components along the measurement beam path to maximize illumination strength, allowing for precise ametropia measurement without the need for a wavefront sensor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a wavefront sensor is used to measure ametropia, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improveametropia measurement precisionVSAvoidmeasurement device complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the essential measurement function from the complex wavefront sensor and implements it through a simplified optical setup using a retinal illuminator, beam splitter, and camera. This extraction maintains measurement capability while eliminating unnecessary complexity and cost associated with traditional wavefront sensors.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates an optical copy of the retinal image through the eye's optical system. By capturing the focused light pattern on the retina and analyzing its position and characteristics, the system determines ametropia without requiring direct wavefront analysis, thus simplifying the measurement device while preserving measurement precision.

Inventive Principle:
Principle #26Copying

2Measurement precision

If a wavefront sensor is used to measure ametropia, then measurement precision is improved, but installation space requirement increases

Engineering Contradiction:
Improveametropia measurement precisionVSAvoidinstallation space
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent merges the measurement function with the existing surgical microscope's optical path. The retinal illuminator, beam splitter, and camera are integrated into the microscope's existing structure, allowing ametropia measurement without requiring separate installation space for a dedicated wavefront sensor system.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If a wavefront sensor is used to measure ametropia, then measurement precision is improved, but sensitivity to stray light increases

Engineering Contradiction:
Improveametropia measurement precisionVSAvoidstray light sensitivity
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The patent converts the potential harmful effect of stray light into a beneficial measurement mechanism. By using the focused light pattern on the retina as the measurement signal and analyzing its position through the camera, the system inherently rejects stray light because the measurement is based on the precise focal point location rather than overall wavefront characteristics that are susceptible to stray light interference.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach simplifies the measurement of ametropia, reduces costs, and enhances integration and usability by using a more compact and robust method that is less sensitive to stray light, providing accurate refractive error measurements.

Implementation Method 1

The position of the image plane of the retina depends on the refractive power of the lens and, therefore, on the ametropia of the eye

Methodology Applied
Scientific EffectRefraction: Refraction

Implementation Method 2

A portion of the measurement light is reflected by the retina and provided to a measurement module by optics

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS9615740B2Eye surgery microscope having an entity for measuring an ametropia
Publication Date: 2017.04.11 CARL ZEISS MEDITEC AG
  • US9615740B2 patent drawing
  • US9615740B2 patent drawing
  • US9615740B2 patent drawing

AI summary

An eye surgery microscope 1 having an illumination beam path 9 for imaging a portion of an eye 3 of a patient and a measurement beam path 25 for measuring an ametropia of the eye. The microscope comprises an objective lens 11 having an objective plane 13 in which the eye of the patient is disposable; at least one ocular 17 or a camera 19 for generating and detecting an image of the object plane, respectively; a measurement light source for generating a measurement light beam 29; a measurement module 41 having a light detector; optics traversed by the measurement beam path for directing the measurement light beam onto the retina 7 of the eye of the patient and for providing measurement light 39 reflected at the retina to the measurement module; and a controller; wherein the measurement module and the controller are configured to determine a position of an image of the retina generated by the optics along the measurement beam path and to output a measurement value representing the ametropia of the eye of the patient.