Fabric Pattern Characterization Using Broadband Spectral Segmentation
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Solution Overview
Problem
Existing methods for characterizing patterns on fabrics, such as those described in US-A1-2010290032 and WO-A1-2018035538, are limited by the use of monochromatic sources and lack an objective measuring system for quantitative characterization, particularly in determining the brightness contrast and visibility of marked patterns.
Innovation Solution
A system utilizing a broadband light source, a parabolic mirror, and a wavelength division unit to separate scattered light into spectral bands, combined with a computing device to analyze electrical voltage signals and compute quality measures like visibility curves and contrast, allowing for quantitative characterization of patterns on fabrics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If monochromatic light sources are used for fabric characterization, then the measurement system can be simpler, but the ability to characterize patterns across different wavelengths is limited
Solution Approach 1:
The broadband spectrum is segmented into multiple spectral bands using a wavelength division unit with dichroic mirrors, directing different wavelength ranges to separate detectors. This allows simultaneous measurement across multiple wavelengths while maintaining a relatively simple system architecture.
Solution Approach 2:
The system uses a single broadband light source that provides multiple wavelengths simultaneously, making the measurement system versatile for characterizing different fabric types and patterns without requiring multiple separate monochromatic sources.
2Device complexity
If subjective visual inspection is used for pattern characterization, then the process is simpler, but quantitative measurement capability is lacking
Solution Approach 1:
The subjective visual inspection process is replaced with an automated optical measurement system that captures scattered light spectra and uses algorithms to objectively quantify pattern characteristics such as brightness contrast and visibility, eliminating human subjectivity.
Solution Approach 2:
The system incorporates feedback through computational algorithms that analyze the captured spectral data and provide quantitative measurements of pattern properties, enabling precise characterization and comparison of fabric patterns.
3Measurement precision
If broadband light source with wavelength division is used, then spectral characterization accuracy is improved, but device complexity increases
Solution Approach 1:
The wavelength division unit segments the broadband spectrum into distinct spectral bands using dichroic mirrors, with each band directed to specialized detectors. This segmentation enables precise spectral characterization while organizing the complexity into manageable functional modules.
4Measurement precision
If traditional spectrophotometer systems are used for textile analysis, then color measurement is possible, but dynamic pattern visibility characterization is limited
Solution Approach 1:
The system is designed to be multi-functional, capable of both traditional colorimetric measurements and dynamic assessment of pattern visibility characteristics such as brightness contrast and stripe observation, replacing the need for separate specialized systems.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables rapid and accurate characterization of patterns on fabrics, including denim, by analyzing electrical voltage signals to determine visibility and contrast, facilitating efficient quality measurement and reproduction of patterns.
Implementation Method 1
a light source configured to generate a light beam, having a broadband spectrum (i.e. the light beam is composed by a large number of radiation components of different wavelengths that are emitted simultaneously by the light source)
Implementation Method 2
an optical arrangement configured to direct said light beam towards the fabric and to collect scattered light of said fabric upon said impingement
Implementation Method 3
collect scattered light of said fabric upon said impingement
Implementation Method 4
The wavelength division unit is configured to separate the scattered light component into a plurality of spectral bands or colors, providing a plurality of signals of different wavelengths
Implementation Method 5
The light detection unit is configured to detect the cited plurality of signals of different wavelengths and to convert them into electrical voltage signals
Data Source
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AI summary
A system and a method for characterization of patterns marked on fabrics are described. The system comprises a light source (10) to generate a light beam to impinge on a fabric (1); an optical arrangement (20), comprising a parabolic mirror (21) with a hole and an optical device (22), to direct said light beam towards the fabric (1); a wavelength division unit (30); a light detection unit (31); and a computing device (40). The optical device (22) changes and orients the direction of the light beam towards the fabric (1) providing a scan of an area of the fabric (1), line-by-line, and redirects scattered light towards the light detection unit (31). The wavelength division unit separates the scattered light into a plurality of spectral bands or colors and the computing device (40) characterizes a pattern marked on the fabric (1) by executing an algorithm that analyzes one of the separated spectral bands and that computes a quality measure of said marked pattern.