Facility device management apparatus and abnormality detection method for facility device

The patent segments the facility devices into multiple groups based on their specifications and operating environments. Instead of constructing a separate complex mathematical model for each individual device, the system creates a determination value for each group by comparing feature values of devices within the same group. This segmentation approach maintains detection accuracy by accounting for device-specific characteristics while significantly reducing the computational burden and complexity of model construction.

The patent applies the local quality principle by creating determination values that are specific to each group of facility devices with similar specifications and operating environments. Instead of using a single general model for all devices, the system tailors the determination values to local characteristics of each group, thereby maintaining detection accuracy while still simplifying management through grouping. This allows the system to account for environmental variations without requiring individualized complex models for each device.

The patent implements preliminary action by pre-calculating determination values for each group of facility devices based on their historical operation data and characteristics. These determination values are stored and can be directly applied when monitoring devices, eliminating the need for complex real-time analysis while accounting for degradation over time. This approach maintains ease of operation by using pre-computed reference values while improving reliability by incorporating temporal degradation effects into the determination criteria.