Fail Bit Repair Method for Integrated Circuits
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Solution Overview
Problem
Current redundant circuit allocation methods for Fail Bit (FB) repair in integrated circuits are non-optimal, leading to high operation costs and inefficiencies due to a large number of candidate combinations and ineffective calculation methods that fail to timely determine if a solution exists, resulting in long operation times and scrapped chips.
Innovation Solution
A method and device for FB repair that involves determining target repair banks, performing first and second repair processing using redundant circuits, and employing an optimal combined detection manner to identify candidate repair combinations and costs, thereby determining a target repair solution for unrepaired FBs, which reduces operation costs and improves allocation efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If non-optimal redundant circuit allocation method is used, then the repair process is simple, but the operation cost is high and many chips are scrapped
Solution Approach 1:
The patent performs preliminary actions by first determining target repair banks, then performing first repair processing on first FBs, and determining second FBs before final repair. This staged approach prepares the repair plan in advance, avoiding unnecessary operations and reducing overall operation costs while maintaining repair effectiveness.
Solution Approach 2:
The patent changes the allocation parameters by introducing optimal combined detection manner to determine candidate repair combinations and costs, then selecting target repair solutions based on calculated repair costs. This parameter optimization reduces operation costs by avoiding redundant allocations while maintaining repair simplicity.
2Speed
If non-optimal redundant circuit allocation method is used, then the allocation process is fast, but the repair efficiency is low and operation time is long
Solution Approach 1:
The patent segments the repair process into distinct stages: determining target repair banks, performing first repair processing, determining second FBs, and performing second repair processing. This segmentation allows each stage to be optimized independently, maintaining fast allocation while improving overall repair efficiency through structured processing.
Solution Approach 2:
The patent implements feedback mechanisms by determining candidate repair combinations and costs, then using this information to select target repair solutions. The optimal combined detection manner provides feedback on repair effectiveness, allowing the system to adjust and optimize the repair process, thereby improving repair efficiency without significantly increasing operation time.
3Device complexity
If non-optimal redundant circuit allocation method is used, then the detection process is simple, but the number of candidate combinations is large and calculation is ineffective
Solution Approach 1:
The patent extracts and removes unnecessary candidate combinations through the optimal combined detection manner. By first determining target repair banks and performing preliminary repair processing, the system identifies and eliminates invalid or redundant repair combinations early in the process, reducing the quantity of candidates that require full evaluation and improving calculation effectiveness.
Data Source
AI summary
A method and device for Fail Bit (FB) repairing. The method includes: a bank to be repaired of a chip to be repaired is determined; first repair processing is performed on first FBs in each target repair bank using a redundant circuit; second FBs are determined, and second repair processing is performed on the second FBs through a state judgment repair operation; for each target repair bank, unrepaired FBs in the target repair bank is determined, and candidate repair combinations and candidate repair costs of the unrepaired FBs are determined using an optimal combined detection manner; and a target repair cost is determined according to the candidate repair costs, and a target repair solution corresponding to the target repair cost is determined to perform repair processing on the unrepaired FBs according to the target repair solution.