Fault Analysis Device for Signal Interference Detection

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Solution Overview

Problem

Current technologies lack an effective method to analyze and address signal interference issues in complex electronic circuits, which can lead to abnormal operations and system failures.

Innovation Solution

A fault analysis device and method that utilize a sensing circuit to detect distorted signals in abnormal signal devices and a signal generating circuit to create a fault test signal, replicating the signal distortion characteristics in a standard device with the same circuit architecture, to determine the cause of signal interference.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If circuit density and complexity are increased to satisfy requirements for high efficiency and multiple functions, then productivity and functionality are improved, but signal interference increases causing abnormal operations and system failures

Engineering Contradiction:
ImproveefficiencyVSAvoidsystem stability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent creates a standard device that copies the circuit architecture of the abnormal signal device, including the same signal transmission paths and components. This copy is used to reproduce and analyze signal interference characteristics without affecting the original abnormal device, enabling fault analysis through controlled experimentation.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The patent introduces a fault analysis device as an intermediary system that includes a sensing circuit to detect signal distortion and a signal generating circuit to reproduce interference. This intermediary device mediates between the abnormal signal device and the analysis process, allowing systematic study of interference causes.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Adaptability or versatility

If circuit density and complexity are increased to satisfy requirements for multiple functions, then adaptability is improved, but signal interference becomes more severe leading to abnormal operations

Engineering Contradiction:
Improvemultiple functionsVSAvoidsignal interference
Core Design Contradiction:
Adaptability or versatilityVSObject-affected harmful factors

Solution Approach 1:

The standard device replicates the circuit architecture of the abnormal device, including all signal transmission paths and components that generate interference. This copy allows systematic reproduction of interference conditions under controlled settings, enabling analysis of how circuit complexity and multi-functionality contribute to signal interference.

Inventive Principle:
Principle #26Copying

3Device complexity

If no fault analysis method is used, then device complexity remains low, but the ability to detect and measure signal interference causes is insufficient

Engineering Contradiction:
Improveanalysis system complexityVSAvoidfault detection capability
Core Design Contradiction:
Device complexityVSDifficulty of detecting and measuring

Solution Approach 1:

The patent uses a simplified standard device that copies only the necessary circuit architecture elements to reproduce signal interference. This selective copying approach maintains manageable device complexity while providing sufficient fault analysis capability through controlled reproduction of interference conditions.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The fault analysis device serves as an intermediary measurement system that detects signal distortion characteristics. By separating the detection function from the complex abnormal device, the system achieves improved fault detection capability without requiring complete complexity of the original device for analysis purposes.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS12339732B2Fault analysis device and fault analysis method thereof
Publication Date: 2025.06.24 NAN YA TECH
  • US12339732B2 patent drawing
  • US12339732B2 patent drawing

AI summary

A fault analysis device and a fault analysis method of the fault analysis device are provided. A sensing circuit senses a first distorted signal on a first signal transmission path of an abnormal signal device when the abnormal signal device performs a preset operation. A signal generating circuit provides a fault test signal to a second signal transmission path of a standard device corresponding to the first signal transmission path when the standard device performs the preset operation, so as to generate a second distorted signal on the second signal transmission path, where the first distorted signal and the second distorted signal have the same signal distortion characteristics.