Fault Waveform Recorder Dynamic Sampling Rate Memory Optimization
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Solution Overview
Problem
Existing fault waveform recording devices for power systems face challenges in reducing memory storage capacity while meeting high sampling rate and long recording time requirements, especially in unattended substations, leading to increased costs due to the need for large non-volatile memory.
Innovation Solution
A fault waveform recording device with a dual storage system that differentiates between normal and abnormal conditions, storing data at high sampling rates only during fault events and decimating data during non-critical intervals to reduce storage needs, utilizing a first storage for up-to-date normal data and a second storage for decimated fault data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high sampling rate is maintained throughout the first period to ensure accurate fault analysis, then measurement precision is improved, but memory storage capacity increases excessively
Solution Approach 1:
The patent applies dynamic sampling rate adjustment by switching between first sampling rate (during abnormality) and second sampling rate (during normal operation). The sampling rate is not fixed but changes based on system state, resolving the contradiction between maintaining high precision during faults and reducing overall storage requirements.
Solution Approach 2:
The patent changes the sampling rate parameter based on detected abnormality conditions. When abnormality is detected, the system switches to first sampling rate for high-precision recording; when normal, it uses second sampling rate to minimize storage usage. This parameter adaptation resolves the contradiction between precision and storage capacity.
2Measurement precision
If high sampling rate is used during the entire first period, then fault analysis accuracy is improved, but the amount of waveform data to be stored increases
Solution Approach 1:
The patent applies different sampling rates to different time intervals based on system state. High sampling rate (first sampling rate) is applied locally during abnormality periods where accurate fault analysis is critical, while lower sampling rate (second sampling rate) is used during normal periods. This local differentiation resolves the contradiction between analysis accuracy and data volume.
Solution Approach 2:
The patent uses excessive sampling rate (first sampling rate) only when necessary during abnormality detection, rather than continuously. During normal operation, it uses reduced sampling rate (second sampling rate). This partial application of high sampling rate maintains fault analysis accuracy while significantly reducing overall waveform data storage volume.
3Adaptability or versatility
If multiple record modes with different sampling rates are provided, then adaptability is improved, but device complexity increases
Solution Approach 1:
The system automatically detects abnormality conditions and self-adjusts the sampling rate without requiring manual intervention or complex control logic. The abnormality detection unit triggers the appropriate recording mode automatically, providing adaptability while keeping the control system relatively simple through self-service operation.
Data Source
AI summary
In a fault waveform recording device, a first storage stores data detected in a power system, the data being up-to-date and indicating an electrical quantity during a first period, and halts the updating of the data stored in the first storage after a second period has elapsed since an abnormality detection time at which an abnormality in the power system is detected. The second period is shorter than the first period. First operation unit stores data in a first interval as is into a second storage, among the data of the first period stored in the first storage after the updating of the data stored in the first storage is halted, the first interval including the abnormality detection time, and decimates data in a second interval different from the first interval.