Feedback-Driven Fuzzing for Electronic Device Testing
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Solution Overview
Problem
Existing fuzzing technologies often operate in an open loop manner, limiting their ability to detect interesting test cases and identify feedback beyond crash events, which restricts their effectiveness in generating further test signals, especially for electronic devices with limited measurable parameters or those operating in constrained environments.
Innovation Solution
The implementation of a system and method that provides a first test signal to an electronic device, monitors its response, determines an expected response using a response model, and adjusts subsequent test signals based on detected and expected responses, enabling the detection of feedback beyond crash events and improving the identification of interesting test cases.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If open loop fuzzing is used, then the system is simple to operate, but the ability to detect interesting test cases and identify feedback is limited
Solution Approach 1:
The patent implements a feedback-driven fuzzing system where the fuzzer monitors device responses (crashes, parameter changes, state transitions) and uses this feedback to dynamically generate subsequent test signals. The response model analyzes detected responses to determine whether they represent interesting test cases, creating a closed-loop system that continuously improves testing effectiveness based on actual device behavior.
2Loss of information
If traditional fuzzing is used, then crash events can be detected, but feedback beyond crash events cannot be identified
Solution Approach 1:
The patent extends feedback detection beyond the traditional crash dimension by monitoring additional response dimensions including parameter changes, state transitions, and operational behavior modifications. The response model evaluates multiple response types simultaneously, transforming the single-dimensional crash detection approach into a multi-dimensional feedback analysis system that captures comprehensive device responses.
3Adaptability or versatility
If fuzzing is applied to devices with limited measurable parameters, then testing coverage is restricted, but the system remains compatible with constrained environments
Solution Approach 1:
The patent adapts the fuzzing approach to devices with limited measurable parameters by dynamically adjusting the response model based on available feedback types. The system identifies which parameters can be measured in the constrained environment and modifies its feedback analysis accordingly, using alternative response indicators such as operational state changes or timing variations when traditional measurement parameters are unavailable, thereby maintaining testing effectiveness across diverse device configurations.
Data Source
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AI summary
A system can include one or more processors (112) and computer-readable instructions that when executed by the one or more processors (112), cause the one or more processors (112) to provide a first test signal (216) to an electronic device (128), monitor at least one parameter of the electronic device (128) during a time period subsequent to the test signal (216) being provided to the electronic device (128), determine, based on the at least one parameter, a detected response of the electronic device (128) to the first test signal (216), determine, using a response model (204), an expected response of the electronic device (128) to the first test signal (216), and provide a second test signal (216) based on the detected response and the expected response to the electronic device (128). The system can include a communications circuit (120) that provides the test signal (216) and receives at least some feedback (220) indicating the parameters, and sensors (124) that receive at least some feedback (220) indicating the parameters.