Feeder Camera Offset Measurement for Pick and Place Accuracy
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Solution Overview
Problem
Current pick and place systems face limitations such as reduced speed, increased complexity, and higher error risks due to multiple picks and places, as well as multiple imaging processes, which complicate the component handling and inspection process.
Innovation Solution
A feeder system with a camera system that measures the offset between topside features and component outlines before picking, allowing for accurate positioning and reducing the need for additional imaging steps by integrating inspection directly into the feeder system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple imaging stations are used to inspect components at different stages, then inspection coverage is improved, but device complexity increases
Solution Approach 1:
The patent combines multiple imaging functions into a single integrated imaging station. The imaging device captures images of components at the feeder level, eliminating the need for separate imaging stations at pick and place locations. This merging approach maintains comprehensive inspection coverage while significantly reducing system complexity.
Solution Approach 2:
The single imaging station performs multiple functions: it inspects component outlines, detects topside features, and provides alignment data all in one location. This multi-functional approach replaces what would traditionally require multiple specialized imaging stations, reducing complexity while maintaining inspection thoroughness.
2Measurement precision
If multiple picks and places are performed to handle components through inspection plates, then inspection accuracy is improved, but productivity decreases
Solution Approach 1:
The imaging device captures and processes component images at the feeder level before picking occurs. By performing inspection and alignment measurements in advance at the source location, the system eliminates the need for subsequent picks and places at inspection plates, thereby maintaining accuracy while improving handling speed.
Solution Approach 2:
The patent extracts the inspection function from the pick-and-place process and relocates it to the feeder level. This separation allows component inspection to occur independently of the picking operation, enabling parallel processing and eliminating the bottleneck created by sequential inspection at intermediate plates.
3Measurement precision
If multiple component handling steps are implemented for inspection, then inspection thoroughness is improved, but reliability decreases
Solution Approach 1:
By consolidating all inspection functions into a single imaging station at the feeder level, the patent reduces the number of times components are handled. This single-location approach maintains thorough inspection of both outlines and topside features while minimizing error risks associated with multiple handling steps and intermediate transfer locations.
Data Source
AI summary
A feeder system includes a feeder configured to receive a component, a pick location configured to present the component from the carrier tape for a subsequent picking process, a camera system configured to view the component at or prior to the pick location. The camera system is configured to measure an offset between one or more topside features of the component and an outline of the component. A pick and place machine that includes the feeder, and a method of inspecting components.