Power Feeder Fault Location Using RMS Voltage Decay
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Solution Overview
Problem
Existing fault location determination methods in power feeder lines are inefficient and require computationally expensive network models and costly voltage phasor sensors, leading to prolonged downtime and scalability issues.
Innovation Solution
Utilizing RMS voltage measurements from sensors along the power feeder line, analyzing decay rates between successive pairs of sensors, and determining fault location based on relative decay rates without the need for network models or phasor measurements, enabling fault ride-through capability during outages.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If network models and voltage phasor sensors are used for fault location determination, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts only the essential measurement data (voltage magnitude at different locations) needed for fault location, discarding the complex network models and phasor measurement requirements. By taking out only the critical information (voltage decay patterns along the feeder), the system achieves adequate measurement precision without the burden of complex infrastructure.
Solution Approach 2:
The patent replaces expensive, complex voltage phasor sensors with simpler, cheaper voltage magnitude sensors. The system uses basic RMS voltage measurements that can be obtained from standard sensors rather than requiring sophisticated phasor measurement units, thereby reducing device complexity and cost while maintaining functional capability for fault location.
2Measurement precision
If network models and phasor measurements are used, then fault location accuracy is improved, but computation time and processing requirements increase
Solution Approach 1:
The patent extracts only the essential pattern (voltage decay rate along the feeder line) needed for fault location, eliminating the need for complex network model computations. By focusing only on the critical decay pattern rather than performing full network analysis, the system achieves fast fault location with minimal computation time.
Solution Approach 2:
The patent applies partial action by using only the necessary subset of information (voltage magnitude decay pattern) rather than performing complete phasor measurements and network model analysis. This partial approach to measurement and analysis significantly reduces computation time while providing sufficient accuracy for fault location determination.
3Reliability
If advanced metering infrastructure with two-way communication is deployed, then system monitoring capability is improved, but infrastructure cost and complexity increase
Solution Approach 1:
The patent extracts only the essential monitoring data (voltage magnitude at sensor locations) needed for fault detection and location, eliminating the need for complex two-way communication infrastructure. By taking out only the critical measurement data rather than implementing full advanced metering infrastructure, the system achieves adequate monitoring capability with simpler, more cost-effective means.
Data Source
AI summary
In a described example, a method can include receiving a first voltage measurement, a second voltage measurement, and a third voltage measurement from a first sensor, a second sensor, and a third sensor, respectively. The voltage measurements can be root mean square (RMS) voltage measurements, for example. The first, second, and third sensors are located respectively at a first location, a second location, and a third location along a power feeder line. The method can include analyzing a first decay rate between the first voltage measurement and the second voltage measurement, analyzing a second decay rate between the second voltage measurement and the third voltage measurement, and determining a fault location at a location between the first location and the second location based on the second decay rate being less than the first decay rate.