Ferroelectric Gate Structure for Low-Voltage Scaled MOSFETs

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Solution Overview

Problem

The scale-down of metal-oxide-semiconductor field-effect transistors (MOS-FETs) in semiconductor devices leads to deterioration in operational properties, necessitating improvements in electric characteristics and reduced operation voltage.

Innovation Solution

Incorporating a ferroelectric pattern between the active patterns and the gate electrode, with a work function metal pattern and electrode pattern, to create a negative capacitance effect, enhancing sub-threshold swing characteristics and reducing operation voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If MOS-FETs are scaled down to meet increasing demand for small pattern size, then device size is reduced, but operational properties deteriorate

Engineering Contradiction:
Improvedevice sizeVSAvoidoperational properties
Core Design Contradiction:
Area of moving objectVSReliability

Solution Approach 1:

A ferroelectric pattern is introduced as an intermediary layer between the gate electrode and the active pattern. This ferroelectric layer generates a negative capacitance effect that amplifies the gate voltage, thereby improving the operational properties of the scaled-down MOS-FET without requiring larger device dimensions.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The work function of the gate electrode is modified by using a multi-layer structure comprising a first work function metal pattern and a second work function metal pattern. This changes the electrical parameters of the gate, enabling better control over the threshold voltage and improving the overall performance of the scaled-down device.

Inventive Principle:
Principle #35Parameter changes

2Area of moving object

If MOS-FETs are scaled down, then pattern size is reduced, but sub-threshold swing characteristics deteriorate

Engineering Contradiction:
Improvepattern sizeVSAvoidsub-threshold swing characteristics
Core Design Contradiction:
Area of moving objectVSManufacturing precision

Solution Approach 1:

The ferroelectric pattern serves as a mediator that enhances the sub-threshold swing characteristics through negative capacitance. This allows scaled-down devices to maintain steep sub-threshold swing without compromising the pattern size reduction.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Area of moving object

If MOS-FETs are scaled down, then device dimensions are reduced, but operation voltage increases

Engineering Contradiction:
Improvedevice dimensionsVSAvoidoperation voltage
Core Design Contradiction:
Area of moving objectVSUse of energy by moving object

Solution Approach 1:

The ferroelectric pattern acts as a voltage amplifier through the negative capacitance effect. It boosts the effective gate voltage without requiring an increase in the actual applied voltage, thereby enabling scaled-down devices to operate at lower voltages while maintaining adequate drive current.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

By adjusting the work function of the gate electrode through the multi-layer metal structure, the threshold voltage is optimized to enable low-voltage operation in scaled-down devices.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The ferroelectric pattern improves sub-threshold swing characteristics and reduces operation voltage by inducing a negative capacitance effect, thereby enhancing the performance of semiconductor devices.

Implementation Method 1

Incorporating a ferroelectric pattern between the active patterns and the gate electrode, with a work function metal pattern and electrode pattern, to create a negative capacitance effect, enhancing sub-threshold swing characteristics and reducing operation voltage

Methodology Applied
Scientific EffectNegative capacitance effect: Capacitance

Data Source

PatentUS11888063B2Semiconductor device
Publication Date: 2024.01.30 SAMSUNG ELECTRONICS CO LTD
  • US11888063B2 patent drawing
  • US11888063B2 patent drawing
  • US11888063B2 patent drawing

AI summary

A semiconductor device includes a substrate including an active pattern, a gate electrode crossing the active pattern in a plan view, and a ferroelectric pattern interposed between the active pattern and the gate electrode. The gate electrode includes a work function metal pattern disposed on the ferroelectric pattern, and an electrode pattern filling a recess formed in an upper portion of the work function metal pattern. A top surface of a topmost portion of the ferroelectric pattern is lower than a bottom surface of the recess.